Elke Van de Casteele
University of Antwerp
Vision Lab, Department of Physics
Universiteitsplein 1 (CDE, N1.11)
B-2610 Wilrijk, Belgium
Elke Van de Casteele graduated in physics at the University of Antwerp in 1998. She received a PhD in 2004 for the work entitled “Model-based approach for Beam Hardening Correction and Resolution measurements in Microtomography”, which was carried out at the Vision Lab. Before her actual PhD-defense she started working at SkyScan, an SME specialized in the development and manufacturing of X-ray micro- and nano-CT systems. In 2010 she returned to the university as a post-doctoral researcher.
My main passion and interest is X-ray micro-tomography with its different applications and challenges in imaging and image analysis.