Atom-counting in High Resolution Electron Microscopy: TEM or STEM - that’s the question

TitleAtom-counting in High Resolution Electron Microscopy: TEM or STEM - that’s the question
Publication TypeJournal Article
Year of Publication2017
AuthorsJ. Gonnissen, A. De Backer, A J. den Dekker, J. Sijbers, and S. Van Aert
JournalUltramicroscopy
Volume147
Pagination112–120
DOI10.1016/j.ultramic.2016.10.011
Research area: