Neural Network Based X-Ray Tomography for Fast Inspection of Apples on a Conveyor Belt

TitleNeural Network Based X-Ray Tomography for Fast Inspection of Apples on a Conveyor Belt
Publication TypeConference Paper
Year of Publication2015
AuthorsE. Janssens, J. De Beenhouwer, M. Van Dael, P. Verboven, B. Nicolai, and J. Sijbers
Conference NameIEEE International Conference on Image Processing
Pagination917-921
Date PublishedSept 21-27
DOI10.1109/ICIP.2015.7350933
Research area: