Publications
Export 1 results:
Author Type [ Year] Filters: First Letter Of Last Name is R and Author is Michael Reiter [Clear All Filters]
“Defect detectability analysis via Probability of defect detection between traditional and deep learning methods in numerical simulations”, e-Journal of Nondestructive Testing, vol. 28, no. 3, 2023. Download paper (2.37 MB)
,