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J. De Beenhouwer, Sijbers, J., and Vanthienen, P. - J., “Mask assembly for edge illumination phase contrast radiation imaging”, U.S. Patent EP2025062978W2024.PDF icon mask_patent.pdf (6.93 MB)
J. De Beenhouwer, Palenstijn, W. J., Bleichrodt, F., Batenburg, K. J., and Sijbers, J., “A framework for markerless alignment with full 3D flexibility”, European Microscopy Conference. 2012.PDF icon Download abstract (117.9 KB)
J. De Beenhouwer and Sijbers, J., “A PHASE‑CONTRAST X‑RAY IMAGING SYSTEM FOR OBTAINING A DARK‑FIELD IMAGE AND A METHOD THEREFOR”, U.S. Patent EP 4 351 425 B12025.PDF icon Download patent (547.58 KB)
S. De Backer and Scheunders, P., “A competitive elliptical clustering algorithm”, Pattern Recognition Letters, vol. 20, pp. 1141-1147, 1999.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., “Chapter Three - Efficient fitting algorithm”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., “Chapter Four - Atom counting”, in Advances in Imaging and Electron Physics,, vol. 217, Science Direct Elsevier, 2021.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., “Chapter Eight - General conclusions and future perspectives”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
A. De Backer, van den Bos, K. H. W., Van den Broek, W., Sijbers, J., and Van Aert, S., “StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images”, Ultramicroscopy, vol. 171, pp. 104–116, 2016.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., “Chapter One - Introduction”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
S. De Backer and Scheunders, P., “Texture segmentation by frequency-sensitive elliptical competitive learning”, in Proc. ICIAP99, International Conference on Image Analysis and Processing , Venice, Italy, september 27-29, 1999, pp. 64-69.
S. De Backer and Scheunders, P., “Enhancement of fMRI image series with the aid of an anatomical image”, in ISBI’06, IEEE International Symposium on Biomedical Imaging, Arlington, Virginia, april 6-9, 2006, pp. 1052-1055.
S. De Backer, Naud, A., and Scheunders, P., “Non-linear Dimensionality Reduction Techniques for Unsupervised Feature Extraction”, Pattern Recognition Letters, vol. 19, pp. 711-720, 1998.
S. De Backer, Kempeneers, P., Debruyn, W., and Scheunders, P., “Wavelet Based Hyperspectral Data Analysis for Vegetation Stress Classification”, in Proc. of Advanced Concepts for Intelligent Vision Systems, Brussels, Belgium, 2004, pp. 387-391.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., “Chapter Five - Optimal experiment design for nanoparticle atom counting from ADF STEM images”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
S. De Backer and Scheunders, P., “Texture segmentation by frequency-sensitive elliptical competitive learning”, Image and Vision Computing, vol. 19, pp. 639-648, 2001.
S. De Backer, Kempeneers, P., Debruyn, W., and Scheunders, P., “Classification of Dune Vegetation from Remotely Sensed Hyperspectral Images”, in Image Analysis and Recognition Proc. of International Conference on Image Analysis and Recognition, Porto, Portugal, 2004, pp. 497-503.
S. De Backer, “Unsupervised Pattern Recognition - Dimensionality Reduction and Classification”, University of Antwerp, Antwerp, 2002.
S. De Backer, Pizurica, A., Huysmans, B., Philips, W., and Scheunders, P., “Denoising of Multicomponent Images Using Wavelet Least-Squares Estimators”, Image and Vision Computing, vol. 26, pp. 1038-1051, 2008.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., “Chapter Two - Statistical parameter estimation theory: principles and simulation studies”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
S. De Backer, Cornelissen, F., Lemeire, J., Nuydens, R., Meert, T., Schelkens, P., and Scheunders, P., “Mosiacing of Fibered Fluorescence Microscopy Video”, Lecture notes in Computer Science, vol. 5259, pp. 915-923, 2008.
S. De Backer, Kempeneers, P., Debruyn, W., and Scheunders, P., “A Band Selection Technique for Spectral Classification”, IEEE Geoscience and Remote Sensing Letters, vol. 2, pp. 319-323, 2005.
M. Das and Liang, Z., “Approximated transport-of-intensity equation for coded-aperture x-ray phase-contrast imaging”, Optics Letters, vol. 39, no. 18, p. 5395, 2014.
F. Danckaers, Huysmans, T., Rogge, S., Van Dael, M., Verboven, P., Nicolai, B., and Sijbers, J., “Building a statistical shape model of the interior and exterior of the bell pepper”, 30th Targeted Technologies for Sustainable Food Systems (EFFoST) International Conference, vol. 28-30 November. Vienna, Austria, 2016.
F. Danckaers, Huysmans, T., Hallemans, A., De Bruyne, G., Truijen, S., and Sijbers, J., “Full Body Statistical Shape Modeling with Posture Normalization”, in The 8th International Conference on Applied Human Factors and Ergonomics (AHFE 2017), Los Angeles, California, USA, 2018, vol. 591, pp. 437-448.PDF icon Download paper (1.12 MB)
F. Danckaers, Stanković, K., Huysmans, T., Booth, B. G., and Sijbers, J., “Foot shape assessment techniques for orthotic and footwear applications: a methodological literature review”, Frontiers in Bioengineering and Biotechnology, vol. 12, pp. 1-15, 2024.PDF icon Download paper (1.99 MB)

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