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Tomography

Computed tomography (CT)

Gratings for multiresolution edge illumination X-ray phase contrast imaging: concept and simulation

P. - J. Vanthienen, Francken, N., Sanctorum, J., Sijbers, J., and De Beenhouwer, J., “Gratings for multiresolution edge illumination X-ray phase contrast imaging: concept and simulation”, Optics Express, vol. 33, no. 8, pp. 17886-17902, 2025.

In-depth imaging of in-vitro tissue models using electrical impedance tomography

J. Deng, Meenaketan, B. Linkoon P., Takalloo, S. Ebrahimi, Chai, Y. Chin, Torfs, T., Braeken, D., De Beenhouwer, J., and Sijbers, J., “In-depth imaging of in-vitro tissue models using electrical impedance tomography”, in iCT 2025 - 14th Conference on Industrial Computed Tomography, 2025, vol. 4 - 7 February.

Single X-ray Projection Material Decomposition using a Mesh Projector

F. Linsen, Iuso, D., and Sijbers, J., “Single X-ray Projection Material Decomposition using a Mesh Projector”, in 14th Conference on Industrial Computed Tomography (iCT), 4 - 7 February 2025, Antwerp, Belgium (iCT 2025), 2025.

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Proximal Neural Networks based reconstruction for few-view CT applications

H. Le, Bossuyt, C., Escoda, J., Costin, M., De Beenhouwer, J., and Sijbers, J., “Proximal Neural Networks based reconstruction for few-view CT applications”, in 14th Conference on Industrial Computed Tomography (iCT), 4 - 7 February 2025, Antwerp, Belgium, 2025.

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Dual Domain Swin Transformer based Reconstruction method for Sparse-View Computed Tomography

J. Van der Rauwelaert, Bossuyt, C., and Sijbers, J., “Dual Domain Swin Transformer based Reconstruction method for Sparse-View Computed Tomography”, in iCT 2025 - 14th Conference on Industrial Computed Tomography (iCT), 4 - 7 February 2025, Antwerp, Belgium, 2025.

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Multi-contrast benchmarking of edge illumination Monte Carlo simulations using virtual gratings

J. Sanctorum, Sijbers, J., and De Beenhouwer, J., “Multi-contrast benchmarking of edge illumination Monte Carlo simulations using virtual gratings”, Journal of Applied Physics, vol. 137, no. 10, p. 104904, 2025.

Efficient X-ray dark field contrast simulations using a condensed history approach

N. Francken, Sanctorum, J., Huyge, B., Sijbers, J., and De Beenhouwer, J., “Efficient X-ray dark field contrast simulations using a condensed history approach”, Optics Express, vol. 33, no. 2, pp. 3562-3576, 2025.

Degradation Detection in Rice Products via Shape Variations in XCT Simulation-Empowered AI

M. Yosifov, Lang, T., Florian, V., Gerth, S., De Beenhouwer, J., Sijbers, J., Kastner, J., and Heinzl, C., “Degradation Detection in Rice Products via Shape Variations in XCT Simulation-Empowered AI”, Journal of Nondestructive Evaluation, vol. 44, no. 10, 2025.

Dynamic flat field correction in edge illumination imaging

D. Gökbel Keklikoğlu, Francken, N., Huyge, B., Merdan, Z., De Beenhouwer, J., and Sijbers, J., “Dynamic flat field correction in edge illumination imaging”, in SPIE Developments in X-Ray Tomography XV, 2024, vol. 13152.

Fast and efficient tetrahedral volume mesh reconstruction with CAD-ASTRA

J. Merckx, den Dekker, A. J., De Beenhouwer, J., and Sijbers, J., “Fast and efficient tetrahedral volume mesh reconstruction with CAD-ASTRA”, in SPIE Developments in X-Ray Tomography XV, San Diego, USA, 2024, vol. 13152.

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