Daniel Frenkel

Daniel Frenkel's picture

Contact

Daniel
Frenkel
Email: 
daniel.frenkel@uantwerpen.be
Address: 

Vision Lab, Department of Physics
University of Antwerp (CDE)
Universiteitsplein 1 (N1.16)
B-2610 Antwerp, Belgium

Phone: 
+32 (0) 3 265 24 49

Personal

Research

Conventional CT inspection approaches typically require many (several hundreds) X-ray projection images from a large number of viewing angles and subsequently a full 3D image reconstruction is performed. This results in a number of limitations: i) due to the lengthy acquisition and reconstruction process, CT is typically performed for offline inspections and R&D activities. Real-time inline CT scanning to achieve a 100% dimensional metrology inspection rate is not possible with the current CT systems. ii) conventional CT systems have a rigid well-defined setup, i.e. requiring either that the object can be put inside the scanner or that the source-detector system can physically rotate 360° around the object. As a result, larger objects such as a wing of an airplane or a partly assembled car cannot be scanned. iii) 3D reconstructed images may suffer from numerous artefacts (due to misalignment, beam hardening, etc.) while the traceability and uncertainty of CT measurements for metrology applications is insufficiently documented.

In my project I will develop novel reconstruction methods for metrology applications where X-ray projections can only be acquired from a limited set of angular viewpoints (typically extended, flat objects). Solutions based on discrete tomography will be targeted. Finally, models will be designed to predict uncertainty for limited angle tomography.