3D Atomic Scale Quantification of Nanostructures and their Dynamics Using Model-based STEM

Publication Type:

Conference Abstract

Authors:

Sandra Van Aert; Annick De Backer; De wael, A; Jarmo Fatermans; Friedrich, T; Ivan Lobato; O'Leary, C M.; Varambhia, A; Thomas Altantzis; Jones, L; Arnold Jan den Dekker; Peter D Nellist; Sara Bals

Source:

Microscopy & Microanalysis 2020 (online), Milwaukee, United States (2020)
Research area: 
Electron Microscopy