Analysis of the effectiveness of deeply supervised neural networks for defect segmentation in additive manufacturing

Publication Type:

Conference Paper

Authors:

Domenico Iuso; Soumick Chatterjee; Rob Heylen; Sven Cornelissen; Jan De Beenhouwer; Jan Sijbers

Source:

SPIE Optical Engineering: Developments in X-Ray Tomography XIV , Volume 12242, p.122421K (2022)
Files: 
PDF icon Download paper (protected)
Research area: 
X-ray imaging
Tomography