Analysis of the effectiveness of deeply supervised neural networks for defect segmentation in additive manufacturing

Publication Type:

Conference Paper

Authors:

Domenico Iuso; Soumick Chatterjee; Rob Heylen; Sven Cornelissen; Jan De Beenhouwer; Jan Sijbers

Source:

SPIE Optical Engineering: Developments in X-Ray Tomography XIV (In Press)
Research area: 
X-ray imaging
Tomography