Home
People
Research
Publications
Software
Open positions
News
Contact
Spin-offs
Log in
Publications
Journal Articles (415)
Conference Papers (454)
Conference Abstracts (209)
Patents (10)
PhD Theses (46)
Book Chapters (21)
Analysis of the effectiveness of deeply supervised neural networks for defect segmentation in additive manufacturing
Publication Type:
Conference Paper
Authors:
Domenico Iuso
;
Soumick Chatterjee
;
Rob Heylen
;
Sven Cornelissen
;
Jan De Beenhouwer
;
Jan Sijbers
Source:
SPIE Optical Engineering: Developments in X-Ray Tomography XIV (In Press)
Google Scholar
BibTeX
Research area:
X-ray imaging
Tomography