CAD-based defect inspection with optimal ROI selection based on polychromatic X-ray projection images

TitleCAD-based defect inspection with optimal ROI selection based on polychromatic X-ray projection images
Publication TypeConference Paper
Year of Publication2019
AuthorsA. Presenti, J. Sijbers, A J. den Dekker, and J. De Beenhouwer
Conference Name9th International Conference on Industrial Computed Tomography
Research area: