CAD-based defect inspection with optimal view angle selection based on polychromatic X-ray projection images

TitleCAD-based defect inspection with optimal view angle selection based on polychromatic X-ray projection images
Publication TypeConference Paper
Year of Publication2019
AuthorsPresenti, A., J. Sijbers, A J. den Dekker, and J. De Beenhouwer
Conference Name9th Conference on Industrial Computed Tomography
Conference LocationPadova, Italy
Research area: