@inproceedings {1499,
	title = {3D imaging of semiconductor components by discrete laminography},
	booktitle = {Stress induced phenomena and reliability in 3D microelectronics: AIP Conference Proceedings},
	volume = {1601},
	year = {2014},
	pages = {168-179},
	doi = { http://dx.doi.org/10.1063/1.4881350},
	author = {Kees Joost Batenburg and Willem Jan Palenstijn and Jan Sijbers}
}
