@article {1665,
	title = {Fast inline inspection by neural network based filtered backprojection: Application to apple inspection},
	journal = {Case Studies in Nondestructive Testing and Evaluation},
	volume = {6},
	year = {2016},
	pages = {14{\textendash}20},
	doi = {10.1016/j.csndt.2016.03.003},
	author = {Eline Janssens and Luis Filipe Alves Pereira and Jan De Beenhouwer and Ing Ren Tsang and Mattias Van Dael and Pieter Verboven and Bart Nicolai and Jan Sijbers}
}
