@article {1665, title = {Fast inline inspection by neural network based filtered backprojection: Application to apple inspection}, journal = {Case Studies in Nondestructive Testing and Evaluation}, volume = {6}, year = {2016}, pages = {14{\textendash}20}, doi = {10.1016/j.csndt.2016.03.003}, author = {Eline Janssens and Luis Filipe Alves Pereira and Jan De Beenhouwer and Ing Ren Tsang and Mattias Van Dael and Pieter Verboven and Bart Nicolai and Jan Sijbers} }