@article {2348,
	title = {Inline edge illumination X-ray phase contrast imaging through mask misalignment},
	journal = {Optics Express},
	volume = {32},
	year = {2024},
	pages = {32048-32061},
	doi = {10.1364/OE.525730},
	author = {Francken, Nicholas and Jonathan Sanctorum and Joaquim Sanctorum and Pieter-Jan Vanthienen and Jan Sijbers and Jan De Beenhouwer}
}
