@inproceedings {2401,
	title = {Correcting for focal spot drift in edge illumination X-ray phase contrast imaging},
	booktitle = {14th Conference on Industrial Computed Tomography (iCT), 4 - 7 February 2025, Antwerp, Belgium},
	year = {2025},
	doi = {doi.org/10.58286/30746},
	author = {Francken, Nicholas and Jonathan Sanctorum and Ben Huyge and Jan Sijbers and Jan De Beenhouwer}
}
