@inproceedings {2443,
	title = {Inline Edge Illumination Computed Tomography: A Simulation Study},
	booktitle = {2026 IEEE 23rd Mediterranean Electrotechnical Conference (MELECON)},
	year = {2026},
	address = {Cairo, Egypt},
	keywords = {edge illumination, Industry 4.0, Inline inspection, Non-destructive testing, X-ray phase contrast computed tomography},
	doi = {https://doi.org/10.1109/MELECON64486.2026.11418832},
	author = {Verstraete, J. and Francken, N. and Jan Sijbers and Jan De Beenhouwer}
}
