@inbook {2154,
	title = {Chapter Eight - General conclusions and future perspectives},
	booktitle = {Advances in Imaging and Electron Physics},
	volume = {217},
	year = {2021},
	publisher = {Science Direct Elsevier},
	organization = {Science Direct Elsevier},
	chapter = {Chapter Eight - General conclusions and future perspectives},
	doi = {10.1016/bs.aiep.2021.01.008},
	author = {Annick De Backer and Jarmo Fatermans and Arnold Jan den Dekker and Sandra Van Aert}
}
@inbook {2152,
	title = {Chapter Five - Optimal experiment design for nanoparticle atom counting from ADF STEM images},
	booktitle = {Advances in Imaging and Electron Physics},
	volume = {217},
	year = {2021},
	publisher = {Science Direct Elsevier},
	organization = {Science Direct Elsevier},
	chapter = {Chapter Five - Optimal experiment design for nanoparticle atom counting from ADF STEM images},
	doi = {10.1016/bs.aiep.2021.01.005},
	author = {Annick De Backer and Jarmo Fatermans and Arnold Jan den Dekker and Sandra Van Aert}
}
@inbook {2150,
	title = {Chapter Four - Atom counting},
	booktitle = {Advances in Imaging and Electron Physics,},
	volume = {217},
	year = {2021},
	publisher = {Science Direct Elsevier},
	organization = {Science Direct Elsevier},
	chapter = {Chapter Four - Atom counting},
	doi = {10.1016/bs.aiep.2021.01.004},
	author = {Annick De Backer and Jarmo Fatermans and Arnold Jan den Dekker and Sandra Van Aert}
}
@inbook {2149,
	title = {Chapter One - Introduction},
	booktitle = {Advances in Imaging and Electron Physics},
	volume = {217},
	year = {2021},
	publisher = {Science Direct Elsevier},
	organization = {Science Direct Elsevier},
	chapter = {One-introduction},
	doi = {10.1016/bs.aiep.2021.01.001},
	author = {Annick De Backer and Jarmo Fatermans and Arnold Jan den Dekker and Sandra Van Aert}
}
@inbook {2153,
	title = {Chapter Seven - Image-quality evaluation and model selection with maximum a posteriori probability},
	booktitle = {Advances in Imaging and Electron Physics},
	volume = {217},
	year = {2021},
	publisher = {Science Direct Elsevier},
	organization = {Science Direct Elsevier},
	chapter = {Chapter Seven - Image-quality evaluation and model selection with maximum a posteriori probability},
	doi = {10.1016/bs.aiep.2021.01.007},
	author = {Jarmo Fatermans and Annick De Backer and Arnold Jan den Dekker and Sandra Van Aert}
}
@inbook {2156,
	title = {Chapter Six - Atom column detection},
	booktitle = {Advances in Imaging and Electron Physics},
	volume = {217},
	year = {2021},
	publisher = {Science Direct Elsevier},
	organization = {Science Direct Elsevier},
	chapter = {Chapter Six - Atom column detection},
	doi = {10.1016/bs.aiep.2021.01.006},
	author = {Jarmo Fatermans and Annick De Backer and Arnold Jan den Dekker and Sandra Van Aert}
}
@inbook {2155,
	title = {Chapter Three - Efficient fitting algorithm},
	booktitle = {Advances in Imaging and Electron Physics},
	volume = {217},
	year = {2021},
	publisher = {Science Direct Elsevier},
	organization = {Science Direct Elsevier},
	chapter = {Chapter Three - Efficient fitting algorithm},
	doi = {10.1016/bs.aiep.2021.01.003},
	author = {Annick De Backer and Jarmo Fatermans and Arnold Jan den Dekker and Sandra Van Aert}
}
@inbook {2151,
	title = {Chapter Two - Statistical parameter estimation theory: principles and simulation studies},
	booktitle = {Advances in Imaging and Electron Physics},
	volume = {217},
	year = {2021},
	publisher = {Science Direct Elsevier},
	organization = {Science Direct Elsevier},
	chapter = {Chapter Two - Statistical parameter estimation theory: principles and simulation studies},
	doi = {10.1016/bs.aiep.2021.01.002},
	author = {Annick De Backer and Jarmo Fatermans and Arnold Jan den Dekker and Sandra Van Aert}
}
@conference {2081,
	title = {3D Atomic Scale Quantification of Nanostructures and their Dynamics Using Model-based STEM},
	year = {2020},
	author = {Sandra Van Aert and Annick De Backer and De wael, A and Jarmo Fatermans and Friedrich, T and Ivan Lobato and O{\textquoteright}Leary, C M. and Varambhia, A and Thomas Altantzis and Jones, L and Arnold Jan den Dekker and Peter D Nellist and Sara Bals}
}
@conference {2094,
	title = {Strategies for quantifying the 3D atomic structure and the dynamics of nanomaterials using model-based STEM},
	year = {2020},
	author = {Sandra Van Aert and Annick De Backer and De wael, A and Jarmo Fatermans and Arslan Irmak, E and Friedrich, T and Ivan Lobato and Jones, L and Arnold Jan den Dekker and Peter D Nellist and Sara Bals}
}
@conference {1959,
	title = {Quantifying 3D atomic structures of nanomaterials and their dynamics using model-based scanning transmission electron microscopy},
	year = {2019},
	author = {Sandra Van Aert and De wael, A and J Fatermans and Ivan Lobato and Annick De Backer and Jones, L and Arnold Jan den Dekker and Peter D Nellist}
}
@conference {1958,
	title = {Strategies for quantifying 3D atomic structures of nanomaterials and their dynamics using dose-efficient ADF STEM},
	year = {2019},
	author = {Sandra Van Aert and De wael, A and J Fatermans and Ivan Lobato and Annick De Backer and Jones, L and Arnold Jan den Dekker and Peter D Nellist}
}
@conference {1957,
	title = {Maximising dose efficiency in quantitative STEM to reveal the 3D atomic structure of nanomaterials},
	year = {2018},
	author = {Sandra Van Aert and J Fatermans and Annick De Backer and van den Bos, K. H. W. and O{\textquoteright}Leary, C M. and M{\"u}ller-Caspary, K and Jones, L and Ivan Lobato and B{\'e}ch{\'e}, A and Arnold Jan den Dekker and Sara Bals and Peter D Nellist}
}
@article {1712,
	title = {Atom-counting in High Resolution Electron Microscopy: TEM or STEM - that{\textquoteright}s the question},
	journal = {Ultramicroscopy},
	volume = {147},
	year = {2017},
	pages = {112{\textendash}120},
	doi = {http://dx.doi.org/10.1016/j.ultramic.2016.10.011},
	author = {Julie Gonnissen and Annick De Backer and Arnold Jan den Dekker and Jan Sijbers and Sandra Van Aert}
}
@article {VanAert:gq5005,
	title = {Advanced electron crystallography through model-based imaging},
	journal = {IUCrJ},
	volume = {3},
	number = {1},
	year = {2016},
	month = {Jan},
	abstract = {The increasing need for precise determination of the atomic arrangement of non-periodic structures in materials design and the control of nanostructures explains the growing interest in quantitative transmission electron microscopy. The aim is to extract precise and accurate numbers for unknown structure parameters including atomic positions, chemical concentrations and atomic numbers. For this purpose, statistical parameter estimation theory has been shown to provide reliable results. In this theory, observations are considered purely as data planes, from which structure parameters have to be determined using a parametric model describing the images. As such, the positions of atom columns can be measured with a precision of the order of a few picometres, even though the resolution of the electron microscope is still one or two orders of magnitude larger. Moreover, small differences in average atomic number, which cannot be distinguished visually, can be quantified using high-angle annular dark-field scanning transmission electron microscopy images. In addition, this theory allows one to measure compositional changes at interfaces, to count atoms with single-atom sensitivity, and to reconstruct atomic structures in three dimensions. This feature article brings the reader up to date, summarizing the underlying theory and highlighting some of the recent applications of quantitative model-based transmisson electron microscopy.},
	keywords = {experimental design, quantitative analysis, statistical parameter estimation, structure refinement, transmission electron microscopy},
	doi = {10.1107/S2052252515019727},
	url = {http://dx.doi.org/10.1107/S2052252515019727},
	author = {Sandra Van Aert and Annick De Backer and Martinez, Gerardo T. and Arnold Jan den Dekker and Dirk Van Dyck and Sara Bals and Van Tendeloo, Gustaaf}
}
@article {1688,
	title = {Detecting and locating light atoms from high-resolution STEM images: the quest for a single optimal design Ultramicroscopy},
	journal = {Ultramicroscopy},
	volume = {170},
	year = {2016},
	pages = {128-138},
	doi = {http://dx.doi.org/10.1016/j.ultramic.2016.07.014},
	author = {Julie Gonnissen and Annick De Backer and Arnold Jan den Dekker and Jan Sijbers and Sandra Van Aert}
}
@conference {1741,
	title = {Investigating lattice strain in Au nanodecahedrons},
	year = {2016},
	doi = {10.1002/9783527808465.EMC2016.5519},
	author = {Bart Goris and Jan De Beenhouwer and Annick De Backer and Daniele Zanaga and Kees Joost Batenburg and Ana S{\'a}nchez-Iglesias and Luis M Liz-Marzán and Sandra Van Aert and Jan Sijbers and Van Tendeloo, Gustaaf and Sara Bals}
}
@article {1704,
	title = {StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images},
	journal = {Ultramicroscopy},
	volume = {171},
	year = {2016},
	pages = {104{\textendash}116},
	doi = {http://dx.doi.org/10.1016/j.ultramic.2016.08.018},
	author = {Annick De Backer and K.H.W. van den Bos and Wouter Van den Broek and Jan Sijbers and Sandra Van Aert}
}
@article {1611,
	title = {Measuring Lattice Strain in Three Dimensions through Electron Microscopy},
	journal = {Nano Letters},
	volume = {15},
	year = {2015},
	pages = {6996{\textendash}7001},
	doi = {10.1021/acs.nanolett.5b03008},
	author = {Bart Goris and Jan De Beenhouwer and Annick De Backer and Daniele Zanaga and Kees Joost Batenburg and Ana S{\'a}nchez-Iglesias and Luis M Liz-Marzán and Sandra Van Aert and Sara Bals and Jan Sijbers and Van Tendeloo, Gustaaf}
}
@article {1497,
	title = {Optimal experimental design for the detection of light atoms from high-resolution scanning transmission electron microscopy images},
	journal = {Applied Physics Letters},
	volume = {105},
	year = {2014},
	doi = {10.1063/1.4892884},
	author = {Julie Gonnissen and Annick De Backer and Arnold Jan den Dekker and G T Martinez and A. Rosenauer and Jan Sijbers and Sandra Van Aert}
}
@article {1395,
	title = {Estimation of unknown structure parameters from high-resolution (S)TEM images: what are the limits?},
	journal = {Ultramicroscopy},
	volume = {134},
	year = {2013},
	pages = {34-43},
	doi = {http://dx.doi.org/10.1016/j.ultramic.2013.05.017},
	url = {http://www.sciencedirect.com/science/article/pii/S0304399113001368},
	author = {Arnold Jan den Dekker and Julie Gonnissen and Annick De Backer and Jan Sijbers and Sandra Van Aert}
}
