@inproceedings {2401,
	title = {Correcting for focal spot drift in edge illumination X-ray phase contrast imaging},
	booktitle = {14th Conference on Industrial Computed Tomography (iCT), 4 - 7 February 2025, Antwerp, Belgium},
	year = {2025},
	doi = {doi.org/10.58286/30746},
	author = {Nicholas Francken and Jonathan Sanctorum and Ben Huyge and Jan Sijbers and Jan De Beenhouwer}
}
@mastersthesis {2415,
	title = {Edge illumination X-ray phase contrast imaging: Advancements in simulations and inline acquisitions},
	volume = {PhD in Sciences: Physics},
	year = {2025},
	type = {PhD thesis},
	author = {Nicholas Francken}
}
@article {2417,
	title = {Edge illumination X-ray phase contrast imaging with continuous mask motion},
	journal = {Optics Express},
	volume = {33},
	year = {2025},
	pages = {41271-41286},
	doi = {https://doi.org/10.1364/OE.570476},
	author = {Ben Huyge and Nicholas Francken and Joaquim Sanctorum and Jonathan Sanctorum and Jan De Beenhouwer and Jan Sijbers}
}
@article {2385,
	title = {Efficient X-ray dark field contrast simulations using a condensed history approach},
	journal = {Optics Express},
	volume = {33},
	year = {2025},
	month = {01/2025},
	pages = {3562-3576},
	doi = {10.1364/OE.544864},
	url = {https://opg.optica.org/oe/fulltext.cfm?uri=oe-33-2-3562\&id=567367},
	author = {Nicholas Francken and Jonathan Sanctorum and Ben Huyge and Jan Sijbers and Jan De Beenhouwer}
}
@article {2405,
	title = {Gratings for multiresolution edge illumination X-ray phase contrast imaging: concept and simulation},
	journal = {Optics Express},
	volume = {33},
	year = {2025},
	pages = {17886-17902},
	doi = {10.1364/OE.550252},
	author = {Pieter-Jan Vanthienen and Nicholas Francken and Jonathan Sanctorum and Jan Sijbers and Jan De Beenhouwer}
}
@article {2323,
	title = {CAD-ASTRA: A versatile and efficient mesh projector for X-ray tomography with the ASTRA-toolbox},
	journal = {Optics Express},
	volume = {32},
	year = {2024},
	pages = {3425-3439},
	doi = {https://doi.org/10.1364/OE.498194},
	author = {Pavel Paramonov and Nicholas Francken and Jens Renders and Domenico Iuso and Tim Elberfeld and Jan De Beenhouwer and Jan Sijbers}
}
@inproceedings {2376,
	title = {Dynamic flat field correction in edge illumination imaging},
	booktitle = {SPIE Developments in X-Ray Tomography XV},
	volume = {13152},
	year = {2024},
	doi = {https://doi.org/10.1117/12.3028319},
	author = {Didem G{\"o}kbel Kekliko{\u g}lu and Nicholas Francken and Ben Huyge and Ziya Merdan and Jan De Beenhouwer and Jan Sijbers}
}
@article {2329,
	title = {Edge illumination x-ray phase contrast simulations using the CAD-ASTRA toolbox},
	journal = {Optics Express},
	volume = {32},
	year = {2024},
	pages = {10005-10021},
	doi = {10.1364/OE.516138},
	url = {https://opg.optica.org/oe/abstract.cfm?doi=10.1364/OE.516138},
	author = {Nicholas Francken and Jonathan Sanctorum and Pavel Paramonov and Jan Sijbers and Jan De Beenhouwer}
}
@conference {2468,
	title = {Inline edge illumination through sample mask misalignment: a proof of concept},
	year = {2024},
	abstract = {Edge illumination (EI) is an X-ray phase contrast imaging setup that allows
measuring two additional complimentary contrasts. The setup consists of two absorbing
masks with slit shaped apertures. Typically, one of the masks is stepped during scans,
complicating the application of EI in inline settings. Current solutions exist, but require
either limiting the number of retrieved contrasts or fabricating specialized masks. In this
work, an EI scanning method with purposely misaligned conventional EI masks is
proposed to enable inline EI. Good agreement is found between conventional and inline EI
flatfield parameters, and first inline scan results are presented.},
	keywords = {X-ray phase contrast imaging},
	url = {https://files.sciconf.cn/upload/file/20240415/20240415160406_47435.pdf},
	author = {Nicholas Francken and Jan De Beenhouwer and Jan Sijbers}
}
@article {2348,
	title = {Inline edge illumination X-ray phase contrast imaging through mask misalignment},
	journal = {Optics Express},
	volume = {32},
	year = {2024},
	pages = {32048-32061},
	doi = {10.1364/OE.525730},
	author = {Nicholas Francken and Jonathan Sanctorum and Joaquim Sanctorum and Pieter-Jan Vanthienen and Jan Sijbers and Jan De Beenhouwer}
}
@inproceedings {2378,
	title = {Multi-resolution gratings for edge illumination x-ray phase contrast imaging: a simulation study},
	booktitle = {Developments in X-Ray Tomography XV},
	volume = {13152},
	year = {2024},
	pages = {1315208},
	publisher = {International Society for Optics and Photonics},
	organization = {International Society for Optics and Photonics},
	keywords = {cone-beam, edge illumination, grating design, magnification, mask, monte-carlo, multi-resolution, Phase contrast},
	doi = {10.1117/12.3025968},
	url = {https://doi.org/10.1117/12.3025968},
	author = {Pieter-Jan Vanthienen and Nicholas Francken and Jan Sijbers and Jan De Beenhouwer}
}
@inproceedings {2287,
	title = {A condensed history approach to x-ray dark field effects in edge illumination phase contrast simulations},
	booktitle = {45th Annual International Conference of the IEEE Engineering in Medicine and Biology Society},
	year = {2023},
	author = {Nicholas Francken and Jonathan Sanctorum and Jens Renders and Pavel Paramonov and Jan Sijbers and Jan De Beenhouwer}
}
@inproceedings {2299,
	title = {Enhancing industrial inspection with efficient edge illumination x-ray phase contrast simulations},
	booktitle = {IEEE EUROCON 2023 -20th International Conference on Smart Technologies, Torino, Italy},
	year = {2023},
	author = {Nicholas Francken and Pavel Paramonov and Jan Sijbers and Jan De Beenhouwer}
}
@conference {2269,
	title = {Edge Illumination Phase Contrast Simulations Using the OptiX GPU Ray Tracing Engine},
	year = {2022},
	author = {Nicholas Francken and Pavel Paramonov and Jan Sijbers and Jan De Beenhouwer}
}
