@conference {2081,
	title = {3D Atomic Scale Quantification of Nanostructures and their Dynamics Using Model-based STEM},
	year = {2020},
	author = {Sandra Van Aert and Annick De Backer and De wael, A and Jarmo Fatermans and Friedrich, T and Ivan Lobato and O{\textquoteright}Leary, C M. and Varambhia, A and Thomas Altantzis and Jones, L and Arnold Jan den Dekker and Peter D Nellist and Sara Bals}
}
@conference {2094,
	title = {Strategies for quantifying the 3D atomic structure and the dynamics of nanomaterials using model-based STEM},
	year = {2020},
	author = {Sandra Van Aert and Annick De Backer and De wael, A and Jarmo Fatermans and Arslan Irmak, E and Friedrich, T and Ivan Lobato and Jones, L and Arnold Jan den Dekker and Peter D Nellist and Sara Bals}
}
@conference {1974,
	title = {Atom column detection from STEM images using the maximum a posteriori probability rule},
	year = {2019},
	author = {J Fatermans and Arnold Jan den Dekker and O{\textquoteright}Leary, C M. and Peter D Nellist and Sandra Van Aert}
}
@conference {1959,
	title = {Quantifying 3D atomic structures of nanomaterials and their dynamics using model-based scanning transmission electron microscopy},
	year = {2019},
	author = {Sandra Van Aert and De wael, A and J Fatermans and Ivan Lobato and Annick De Backer and Jones, L and Arnold Jan den Dekker and Peter D Nellist}
}
@conference {1958,
	title = {Strategies for quantifying 3D atomic structures of nanomaterials and their dynamics using dose-efficient ADF STEM},
	year = {2019},
	author = {Sandra Van Aert and De wael, A and J Fatermans and Ivan Lobato and Annick De Backer and Jones, L and Arnold Jan den Dekker and Peter D Nellist}
}
@conference {1957,
	title = {Maximising dose efficiency in quantitative STEM to reveal the 3D atomic structure of nanomaterials},
	year = {2018},
	author = {Sandra Van Aert and J Fatermans and Annick De Backer and van den Bos, K. H. W. and O{\textquoteright}Leary, C M. and M{\"u}ller-Caspary, K and Jones, L and Ivan Lobato and B{\'e}ch{\'e}, A and Arnold Jan den Dekker and Sara Bals and Peter D Nellist}
}
@article {1878,
	title = {Single Atom Detection from Low Contrast-to-Noise Ratio Electron Microscopy Images},
	journal = {Phys. Rev. Lett.},
	volume = {121},
	year = {2018},
	month = {Jul},
	pages = {056101},
	abstract = {Single atom detection is of key importance to solving a wide range of scientific and technological problems. The strong interaction of electrons with matter makes transmission electron microscopy one of the most promising techniques. In particular, aberration correction using scanning transmission electron microscopy has made a significant step forward toward detecting single atoms. However, to overcome radiation damage, related to the use of high-energy electrons, the incoming electron dose should be kept low enough. This results in images exhibiting a low signal-to-noise ratio and extremely weak contrast, especially for light-element nanomaterials. To overcome this problem, a combination of physics-based model fitting and the use of a model-order selection method is proposed, enabling one to detect single atoms with high reliability.},
	doi = {10.1103/PhysRevLett.121.056101},
	url = {https://link.aps.org/doi/10.1103/PhysRevLett.121.056101},
	author = {J Fatermans and Arnold Jan den Dekker and M{\"u}ller-Caspary, K. and Ivan Lobato and O{\textquoteright}Leary, C. M. and Peter D Nellist and Sandra Van Aert}
}
