@inbook {2154,
	title = {Chapter Eight - General conclusions and future perspectives},
	booktitle = {Advances in Imaging and Electron Physics},
	volume = {217},
	year = {2021},
	publisher = {Science Direct Elsevier},
	organization = {Science Direct Elsevier},
	chapter = {Chapter Eight - General conclusions and future perspectives},
	doi = {10.1016/bs.aiep.2021.01.008},
	author = {Annick De Backer and Jarmo Fatermans and Arnold Jan den Dekker and Sandra Van Aert}
}
@inbook {2152,
	title = {Chapter Five - Optimal experiment design for nanoparticle atom counting from ADF STEM images},
	booktitle = {Advances in Imaging and Electron Physics},
	volume = {217},
	year = {2021},
	publisher = {Science Direct Elsevier},
	organization = {Science Direct Elsevier},
	chapter = {Chapter Five - Optimal experiment design for nanoparticle atom counting from ADF STEM images},
	doi = {10.1016/bs.aiep.2021.01.005},
	author = {Annick De Backer and Jarmo Fatermans and Arnold Jan den Dekker and Sandra Van Aert}
}
@inbook {2150,
	title = {Chapter Four - Atom counting},
	booktitle = {Advances in Imaging and Electron Physics,},
	volume = {217},
	year = {2021},
	publisher = {Science Direct Elsevier},
	organization = {Science Direct Elsevier},
	chapter = {Chapter Four - Atom counting},
	doi = {10.1016/bs.aiep.2021.01.004},
	author = {Annick De Backer and Jarmo Fatermans and Arnold Jan den Dekker and Sandra Van Aert}
}
@inbook {2149,
	title = {Chapter One - Introduction},
	booktitle = {Advances in Imaging and Electron Physics},
	volume = {217},
	year = {2021},
	publisher = {Science Direct Elsevier},
	organization = {Science Direct Elsevier},
	chapter = {One-introduction},
	doi = {10.1016/bs.aiep.2021.01.001},
	author = {Annick De Backer and Jarmo Fatermans and Arnold Jan den Dekker and Sandra Van Aert}
}
@inbook {2153,
	title = {Chapter Seven - Image-quality evaluation and model selection with maximum a posteriori probability},
	booktitle = {Advances in Imaging and Electron Physics},
	volume = {217},
	year = {2021},
	publisher = {Science Direct Elsevier},
	organization = {Science Direct Elsevier},
	chapter = {Chapter Seven - Image-quality evaluation and model selection with maximum a posteriori probability},
	doi = {10.1016/bs.aiep.2021.01.007},
	author = {Jarmo Fatermans and Annick De Backer and Arnold Jan den Dekker and Sandra Van Aert}
}
@inbook {2156,
	title = {Chapter Six - Atom column detection},
	booktitle = {Advances in Imaging and Electron Physics},
	volume = {217},
	year = {2021},
	publisher = {Science Direct Elsevier},
	organization = {Science Direct Elsevier},
	chapter = {Chapter Six - Atom column detection},
	doi = {10.1016/bs.aiep.2021.01.006},
	author = {Jarmo Fatermans and Annick De Backer and Arnold Jan den Dekker and Sandra Van Aert}
}
@inbook {2155,
	title = {Chapter Three - Efficient fitting algorithm},
	booktitle = {Advances in Imaging and Electron Physics},
	volume = {217},
	year = {2021},
	publisher = {Science Direct Elsevier},
	organization = {Science Direct Elsevier},
	chapter = {Chapter Three - Efficient fitting algorithm},
	doi = {10.1016/bs.aiep.2021.01.003},
	author = {Annick De Backer and Jarmo Fatermans and Arnold Jan den Dekker and Sandra Van Aert}
}
@inbook {2151,
	title = {Chapter Two - Statistical parameter estimation theory: principles and simulation studies},
	booktitle = {Advances in Imaging and Electron Physics},
	volume = {217},
	year = {2021},
	publisher = {Science Direct Elsevier},
	organization = {Science Direct Elsevier},
	chapter = {Chapter Two - Statistical parameter estimation theory: principles and simulation studies},
	doi = {10.1016/bs.aiep.2021.01.002},
	author = {Annick De Backer and Jarmo Fatermans and Arnold Jan den Dekker and Sandra Van Aert}
}
@conference {2081,
	title = {3D Atomic Scale Quantification of Nanostructures and their Dynamics Using Model-based STEM},
	year = {2020},
	author = {Sandra Van Aert and Annick De Backer and De wael, A and Jarmo Fatermans and Friedrich, T and Ivan Lobato and O{\textquoteright}Leary, C M. and Varambhia, A and Thomas Altantzis and Jones, L and Arnold Jan den Dekker and Peter D Nellist and Sara Bals}
}
@article {2063,
	title = {Atom column detection from simultaneously acquired ABF and ADF STEM images},
	journal = {Ultramicroscopy},
	volume = {219},
	year = {2020},
	pages = {113046},
	doi = {https://doi.org/10.1016/j.ultramic.2020.113046},
	author = {Fatermans, J. and Arnold Jan den Dekker and M{\"u}ller-Caspary, K. and N Gauquelin and Jo Verbeeck and Sandra Van Aert}
}
@conference {2091,
	title = {Bayesian model selection for atom column detection from ABF-ADF STEM images},
	year = {2020},
	author = {Fatermans, J. and Arnold Jan den Dekker and N Gauquelin and Jo Verbeeck and Sandra Van Aert}
}
@conference {2094,
	title = {Strategies for quantifying the 3D atomic structure and the dynamics of nanomaterials using model-based STEM},
	year = {2020},
	author = {Sandra Van Aert and Annick De Backer and De wael, A and Jarmo Fatermans and Arslan Irmak, E and Friedrich, T and Ivan Lobato and Jones, L and Arnold Jan den Dekker and Peter D Nellist and Sara Bals}
}
@conference {1974,
	title = {Atom column detection from STEM images using the maximum a posteriori probability rule},
	year = {2019},
	author = {J Fatermans and Arnold Jan den Dekker and O{\textquoteright}Leary, C M. and Peter D Nellist and Sandra Van Aert}
}
@conference {1975,
	title = {Atom detection from electron microscopy images},
	year = {2019},
	pages = {15},
	author = {J Fatermans and Arnold Jan den Dekker and Sandra Van Aert}
}
@article {1925,
	title = {The maximum a posteriori probability rule for atom column detection from HAADF STEM images},
	journal = {Ultramicroscopy},
	volume = {201},
	year = {2019},
	pages = {81-91},
	abstract = {Recently, the maximum a posteriori (MAP) probability rule has been proposed as an objective and quantitative method to detect atom columns and even single atoms from high-resolution high-angle annular dark-field (HAADF) scanning transmission electron microscopy (STEM) images. The method combines statistical parameter estimation and model-order selection using a Bayesian framework and has been shown to be especially useful for the analysis of the structure of beam-sensitive nanomaterials. In order to avoid beam damage, images of such materials are usually acquired using a limited incoming electron dose resulting in a low contrast-to-noise ratio (CNR) which makes visual inspection unreliable. This creates a need for an objective and quantitative approach. The present paper describes the methodology of the MAP probability rule, gives its step-by-step derivation and discusses its algorithmic implementation for atom column detection. In addition, simulation results are presented showing that the performance of the MAP probability rule to detect the correct number of atomic columns from HAADF STEM images is superior to that of other model-order selection criteria, including the Akaike Information Criterion (AIC) and the Bayesian Information Criterion (BIC). Moreover, the MAP probability rule is used as a tool to evaluate the relation between STEM image quality measures and atom detectability resulting in the introduction of the so-called integrated CNR (ICNR) as a new image quality measure that better correlates with atom detectability than conventional measures such as signal-to-noise ratio (SNR) and CNR.},
	keywords = {Atom detectability, Atom detection, Model selection, Scanning transmission electron microscopy (STEM)},
	issn = {0304-3991},
	doi = {https://doi.org/10.1016/j.ultramic.2019.02.003},
	url = {http://www.sciencedirect.com/science/article/pii/S0304399118304236},
	author = {J Fatermans and Sandra Van Aert and Arnold Jan den Dekker}
}
@conference {1959,
	title = {Quantifying 3D atomic structures of nanomaterials and their dynamics using model-based scanning transmission electron microscopy},
	year = {2019},
	author = {Sandra Van Aert and De wael, A and J Fatermans and Ivan Lobato and Annick De Backer and Jones, L and Arnold Jan den Dekker and Peter D Nellist}
}
@conference {1958,
	title = {Strategies for quantifying 3D atomic structures of nanomaterials and their dynamics using dose-efficient ADF STEM},
	year = {2019},
	author = {Sandra Van Aert and De wael, A and J Fatermans and Ivan Lobato and Annick De Backer and Jones, L and Arnold Jan den Dekker and Peter D Nellist}
}
@conference {1890,
	title = {Bayesian analysis of noisy scanning transmission electron microscopy images for single atom detection},
	year = {2018},
	pages = {95},
	author = {J Fatermans and Arnold Jan den Dekker and M{\"u}ller-Caspary, K and Ivan Lobato and Sandra Van Aert}
}
@conference {1957,
	title = {Maximising dose efficiency in quantitative STEM to reveal the 3D atomic structure of nanomaterials},
	year = {2018},
	author = {Sandra Van Aert and J Fatermans and Annick De Backer and van den Bos, K. H. W. and O{\textquoteright}Leary, C M. and M{\"u}ller-Caspary, K and Jones, L and Ivan Lobato and B{\'e}ch{\'e}, A and Arnold Jan den Dekker and Sara Bals and Peter D Nellist}
}
@conference {1891,
	title = {The maximum a posteriori probability rule to detect single atoms from low signal-to-noise ratio scanning transmission electron microscopy images},
	year = {2018},
	author = {J Fatermans and Arnold Jan den Dekker and M{\"u}ller-Caspary, K and Ivan Lobato and Sandra Van Aert}
}
@article {1878,
	title = {Single Atom Detection from Low Contrast-to-Noise Ratio Electron Microscopy Images},
	journal = {Phys. Rev. Lett.},
	volume = {121},
	year = {2018},
	month = {Jul},
	pages = {056101},
	abstract = {Single atom detection is of key importance to solving a wide range of scientific and technological problems. The strong interaction of electrons with matter makes transmission electron microscopy one of the most promising techniques. In particular, aberration correction using scanning transmission electron microscopy has made a significant step forward toward detecting single atoms. However, to overcome radiation damage, related to the use of high-energy electrons, the incoming electron dose should be kept low enough. This results in images exhibiting a low signal-to-noise ratio and extremely weak contrast, especially for light-element nanomaterials. To overcome this problem, a combination of physics-based model fitting and the use of a model-order selection method is proposed, enabling one to detect single atoms with high reliability.},
	doi = {10.1103/PhysRevLett.121.056101},
	url = {https://link.aps.org/doi/10.1103/PhysRevLett.121.056101},
	author = {J Fatermans and Arnold Jan den Dekker and M{\"u}ller-Caspary, K. and Ivan Lobato and O{\textquoteright}Leary, C. M. and Peter D Nellist and Sandra Van Aert}
}
@article {1712,
	title = {Atom-counting in High Resolution Electron Microscopy: TEM or STEM - that{\textquoteright}s the question},
	journal = {Ultramicroscopy},
	volume = {147},
	year = {2017},
	pages = {112{\textendash}120},
	doi = {http://dx.doi.org/10.1016/j.ultramic.2016.10.011},
	author = {Julie Gonnissen and Annick De Backer and Arnold Jan den Dekker and Jan Sijbers and Sandra Van Aert}
}
@conference {1889,
	title = {Detection of atomic columns from noisy STEM images},
	year = {2017},
	pages = {445-446},
	author = {J Fatermans and M{\"u}ller-Caspary, K and Arnold Jan den Dekker and Sandra Van Aert}
}
@mastersthesis {1926,
	title = {Optimal statistical experiment design for detecting and locating light atoms using quantitative high resolution (scanning) transmission electron microscopy},
	volume = {PhD in Sciences/Physics},
	year = {2017},
	type = {PhD thesis},
	author = {Julie Gonnissen}
}
@article {VanAert:gq5005,
	title = {Advanced electron crystallography through model-based imaging},
	journal = {IUCrJ},
	volume = {3},
	number = {1},
	year = {2016},
	month = {Jan},
	abstract = {The increasing need for precise determination of the atomic arrangement of non-periodic structures in materials design and the control of nanostructures explains the growing interest in quantitative transmission electron microscopy. The aim is to extract precise and accurate numbers for unknown structure parameters including atomic positions, chemical concentrations and atomic numbers. For this purpose, statistical parameter estimation theory has been shown to provide reliable results. In this theory, observations are considered purely as data planes, from which structure parameters have to be determined using a parametric model describing the images. As such, the positions of atom columns can be measured with a precision of the order of a few picometres, even though the resolution of the electron microscope is still one or two orders of magnitude larger. Moreover, small differences in average atomic number, which cannot be distinguished visually, can be quantified using high-angle annular dark-field scanning transmission electron microscopy images. In addition, this theory allows one to measure compositional changes at interfaces, to count atoms with single-atom sensitivity, and to reconstruct atomic structures in three dimensions. This feature article brings the reader up to date, summarizing the underlying theory and highlighting some of the recent applications of quantitative model-based transmisson electron microscopy.},
	keywords = {experimental design, quantitative analysis, statistical parameter estimation, structure refinement, transmission electron microscopy},
	doi = {10.1107/S2052252515019727},
	url = {http://dx.doi.org/10.1107/S2052252515019727},
	author = {Sandra Van Aert and Annick De Backer and Martinez, Gerardo T. and Arnold Jan den Dekker and Dirk Van Dyck and Sara Bals and Van Tendeloo, Gustaaf}
}
@conference {1888,
	title = {Bayesian model-order selection in electron microscopy to detect atomic columns in noisy images},
	year = {2016},
	pages = {53},
	author = {J Fatermans and Sandra Van Aert and Arnold Jan den Dekker}
}
@article {1688,
	title = {Detecting and locating light atoms from high-resolution STEM images: the quest for a single optimal design Ultramicroscopy},
	journal = {Ultramicroscopy},
	volume = {170},
	year = {2016},
	pages = {128-138},
	doi = {http://dx.doi.org/10.1016/j.ultramic.2016.07.014},
	author = {Julie Gonnissen and Annick De Backer and Arnold Jan den Dekker and Jan Sijbers and Sandra Van Aert}
}
@conference {1741,
	title = {Investigating lattice strain in Au nanodecahedrons},
	year = {2016},
	doi = {10.1002/9783527808465.EMC2016.5519},
	author = {Bart Goris and Jan De Beenhouwer and Annick De Backer and Daniele Zanaga and Kees Joost Batenburg and Ana S{\'a}nchez-Iglesias and Luis M Liz-Marzán and Sandra Van Aert and Jan Sijbers and Van Tendeloo, Gustaaf and Sara Bals}
}
@article {1704,
	title = {StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images},
	journal = {Ultramicroscopy},
	volume = {171},
	year = {2016},
	pages = {104{\textendash}116},
	doi = {http://dx.doi.org/10.1016/j.ultramic.2016.08.018},
	author = {Annick De Backer and K.H.W. van den Bos and Wouter Van den Broek and Jan Sijbers and Sandra Van Aert}
}
@article {1611,
	title = {Measuring Lattice Strain in Three Dimensions through Electron Microscopy},
	journal = {Nano Letters},
	volume = {15},
	year = {2015},
	pages = {6996{\textendash}7001},
	doi = {10.1021/acs.nanolett.5b03008},
	author = {Bart Goris and Jan De Beenhouwer and Annick De Backer and Daniele Zanaga and Kees Joost Batenburg and Ana S{\'a}nchez-Iglesias and Luis M Liz-Marzán and Sandra Van Aert and Sara Bals and Jan Sijbers and Van Tendeloo, Gustaaf}
}
@article {1473,
	title = {A memory efficient method for fully three-dimensional object reconstruction with HAADF STEM Ultramicroscopy},
	journal = {Ultramicroscopy},
	volume = {141},
	year = {2014},
	pages = {22{\textendash}31},
	doi = {http://dx.doi.org/10.1016/j.ultramic.2014.03.008},
	author = {Wouter Van den Broek and A. Rosenauer and Jan Sijbers and Dirk Van Dyck and Sandra Van Aert}
}
@article {1497,
	title = {Optimal experimental design for the detection of light atoms from high-resolution scanning transmission electron microscopy images},
	journal = {Applied Physics Letters},
	volume = {105},
	year = {2014},
	doi = {10.1063/1.4892884},
	author = {Julie Gonnissen and Annick De Backer and Arnold Jan den Dekker and G T Martinez and A. Rosenauer and Jan Sijbers and Sandra Van Aert}
}
@article {1395,
	title = {Estimation of unknown structure parameters from high-resolution (S)TEM images: what are the limits?},
	journal = {Ultramicroscopy},
	volume = {134},
	year = {2013},
	pages = {34-43},
	doi = {http://dx.doi.org/10.1016/j.ultramic.2013.05.017},
	url = {http://www.sciencedirect.com/science/article/pii/S0304399113001368},
	author = {Arnold Jan den Dekker and Julie Gonnissen and Annick De Backer and Jan Sijbers and Sandra Van Aert}
}
@conference {1204,
	title = {Ultra-High Resolution Electron Tomography for Materials Science: A Roadmap},
	year = {2011},
	address = {Nashville, TN, United States},
	doi = {http://dx.doi.org/10.1017/S143192761100554X},
	author = {Kees Joost Batenburg and Sara Bals and Sandra Van Aert and Roelandts, Tom and Jan Sijbers}
}
