@article {1600,
	title = {Easy implementation of advanced tomography algorithms using the ASTRA toolbox with Spot operators},
	journal = {Numerical Algorithms},
	volume = {71},
	number = {3},
	year = {2016},
	pages = {673-697},
	doi = {10.1007/s11075-015-0016-4},
	author = {Folkert Bleichrodt and Tristan van Leeuwen and Willem Jan Palenstijn and Wim Van Aarle and Jan Sijbers and Kees Joost Batenburg}
}
@article {1701,
	title = {Fast and Flexible X-ray Tomography Using the ASTRA Toolbox},
	journal = {Optics Express},
	volume = {24},
	number = {22},
	year = {2016},
	pages = {25129-25147},
	doi = {10.1364/OE.24.025129},
	author = {Wim Van Aarle and Willem Jan Palenstijn and Jeroen Cant and Eline Janssens and Folkert Bleichrodt and Andrei Dabravolski and Jan De Beenhouwer and Kees Joost Batenburg and Jan Sijbers}
}
@article {1674,
	title = {Quantitative 3D analysis of huge nanoparticle assemblies.},
	journal = {Nanoscale},
	volume = {8},
	year = {2016},
	month = {2016 Jan 7},
	pages = {292-9},
	abstract = {Nanoparticle assemblies can be investigated in 3 dimensions using electron tomography. However, it is not straightforward to obtain quantitative information such as the number of particles or their relative position. This becomes particularly difficult when the number of particles increases. We propose a novel approach in which prior information on the shape of the individual particles is exploited. It improves the quality of the reconstruction of these complex assemblies significantly. Moreover, this quantitative Sparse Sphere Reconstruction approach yields directly the number of particles and their position as an output of the reconstruction technique, enabling a detailed 3D analysis of assemblies with as many as 10,000 particles. The approach can also be used to reconstruct objects based on a very limited number of projections, which opens up possibilities to investigate beam sensitive assemblies where previous reconstructions with the available electron tomography techniques failed.},
	issn = {2040-3372},
	doi = {10.1039/c5nr06962a},
	author = {Daniele Zanaga and Folkert Bleichrodt and Thomas Altantzis and Winckelmans, Naomi and Willem Jan Palenstijn and Jan Sijbers and de Nijs, Bart and Marijn A van Huis and Ana S{\'a}nchez-Iglesias and Luis M Liz-Marzán and van Blaaderen, Alfons and Kees Joost Batenburg and Sara Bals and Van Tendeloo, Gustaaf}
}
@article {1626,
	title = {Quantitative 3D analysis of huge nanoparticle assemblies},
	journal = {Nanoscale},
	volume = {8},
	year = {2015},
	pages = {292-299},
	doi = {10.1039/C5NR06962A},
	author = {Daniele Zanaga and Folkert Bleichrodt and Thomas Altantzis and Winckelmans, Naomi and Willem Jan Palenstijn and Jan Sijbers and B. van Nijs and Marijn A van Huis and van Blaaderen, Alfons and Ana S{\'a}nchez-Iglesias and Luis M Liz-Marzán and Kees Joost Batenburg and Sara Bals and Van Tendeloo, Gustaaf}
}
@article {1471,
	title = {Aligning Projection Images from Binary Volumes},
	journal = {Fundamenta Informaticae},
	volume = {135},
	year = {2014},
	pages = {1-22},
	doi = {10.3233/FI-2014-1090},
	author = {Folkert Bleichrodt and Jan De Beenhouwer and Jan Sijbers and Kees Joost Batenburg}
}
@inproceedings {1650,
	title = {An Alignment Method for Fan Beam Tomography},
	booktitle = {International Conference on Tomography of Materials and Structures (ICTMS)},
	year = {2013},
	pages = {103-107},
	author = {Folkert Bleichrodt and Jan De Beenhouwer and Jan Sijbers and Kees Joost Batenburg}
}
@conference {1714,
	title = {A framework for markerless alignment with full 3D flexibility},
	year = {2012},
	author = {Jan De Beenhouwer and Willem Jan Palenstijn and Folkert Bleichrodt and Kees Joost Batenburg and Jan Sijbers}
}
