@article {1857, title = {Advanced X-ray tomography: experiment, modeling, and algorithms}, journal = {Measurement Science and Technology}, volume = {29}, year = {2018}, pages = {080101}, doi = {https://doi.org/10.1088/1361-6501/aacd25}, author = {Kees Joost Batenburg and Francesco De Carlo and Lucia Mancini and Jan Sijbers} } @article {1872, title = {Enhanced contrast in X-ray microtomographic images of the membranous labyrinth using different X-ray sources and scanning modes}, journal = {Journal of Anatomy}, volume = {233}, year = {2018}, pages = {770--782}, doi = {doi: 10.1111/joa.12885}, author = {Jana Goyens and Menelia Vasilopoulou-Kampitsi and Raf Claes and Jan Sijbers and Lucia Mancini} } @article {1792, title = {TomoBank: A Tomographic Data Repository for Computational X-ray Science}, journal = {Measurement Science and Technology}, volume = {29}, year = {2018}, pages = {1-10}, doi = {https://doi.org/10.1088/1361-6501/aa9c19}, author = {Francesco De Carlo and Doga Gursoy and Daniel Ching and Kees Joost Batenburg and Ludwig, Wolfgang and Lucia Mancini and Federica Marone Welford and Rajmund Mokso and Daan Pelt and Jan Sijbers and Mark Rivers} } @article {1615, title = {Dynamic intensity normalization using eigen flat fields in X-ray imaging}, journal = {Optics Express}, volume = {23}, year = {2015}, pages = {27975-27989}, abstract = {In X-ray imaging, it is common practice to normalize the acquired projection data with averaged flat fields taken prior to the scan. Unfortunately, due to source instabilities, vibrating beamline components such as the monochromator, time varying detector properties, or other confounding factors, flat fields are often far from stationary, resulting in significant systematic errors in intensity normalization. In this work, a simple and efficient method is proposed to account for dynamically varying flat fields. Through principal component analysis of a set of flat fields, eigen flat fields are computed. A linear combination of the most important eigen flat fields is then used to individually normalize each X-ray projection. Experiments show that the proposed dynamic flat field correction leads to a substantial reduction of systematic errors in projection intensity normalization compared to conventional flat field correction. }, doi = {10.1364/OE.23.027975}, author = {Vincent Van Nieuwenhove and Jan De Beenhouwer and Francesco De Carlo and Lucia Mancini and Federica Marone and Jan Sijbers} }