@conference {2081,
	title = {3D Atomic Scale Quantification of Nanostructures and their Dynamics Using Model-based STEM},
	year = {2020},
	author = {Sandra Van Aert and Annick De Backer and De wael, A and Jarmo Fatermans and Friedrich, T and Ivan Lobato and O{\textquoteright}Leary, C M. and Varambhia, A and Thomas Altantzis and Jones, L and Arnold Jan den Dekker and Peter D Nellist and Sara Bals}
}
@conference {2094,
	title = {Strategies for quantifying the 3D atomic structure and the dynamics of nanomaterials using model-based STEM},
	year = {2020},
	author = {Sandra Van Aert and Annick De Backer and De wael, A and Jarmo Fatermans and Arslan Irmak, E and Friedrich, T and Ivan Lobato and Jones, L and Arnold Jan den Dekker and Peter D Nellist and Sara Bals}
}
@conference {1957,
	title = {Maximising dose efficiency in quantitative STEM to reveal the 3D atomic structure of nanomaterials},
	year = {2018},
	author = {Sandra Van Aert and J Fatermans and Annick De Backer and van den Bos, K. H. W. and O{\textquoteright}Leary, C M. and M{\"u}ller-Caspary, K and Jones, L and Ivan Lobato and B{\'e}ch{\'e}, A and Arnold Jan den Dekker and Sara Bals and Peter D Nellist}
}
@article {VanAert:gq5005,
	title = {Advanced electron crystallography through model-based imaging},
	journal = {IUCrJ},
	volume = {3},
	number = {1},
	year = {2016},
	month = {Jan},
	abstract = {The increasing need for precise determination of the atomic arrangement of non-periodic structures in materials design and the control of nanostructures explains the growing interest in quantitative transmission electron microscopy. The aim is to extract precise and accurate numbers for unknown structure parameters including atomic positions, chemical concentrations and atomic numbers. For this purpose, statistical parameter estimation theory has been shown to provide reliable results. In this theory, observations are considered purely as data planes, from which structure parameters have to be determined using a parametric model describing the images. As such, the positions of atom columns can be measured with a precision of the order of a few picometres, even though the resolution of the electron microscope is still one or two orders of magnitude larger. Moreover, small differences in average atomic number, which cannot be distinguished visually, can be quantified using high-angle annular dark-field scanning transmission electron microscopy images. In addition, this theory allows one to measure compositional changes at interfaces, to count atoms with single-atom sensitivity, and to reconstruct atomic structures in three dimensions. This feature article brings the reader up to date, summarizing the underlying theory and highlighting some of the recent applications of quantitative model-based transmisson electron microscopy.},
	keywords = {experimental design, quantitative analysis, statistical parameter estimation, structure refinement, transmission electron microscopy},
	doi = {10.1107/S2052252515019727},
	url = {http://dx.doi.org/10.1107/S2052252515019727},
	author = {Sandra Van Aert and Annick De Backer and Martinez, Gerardo T. and Arnold Jan den Dekker and Dirk Van Dyck and Sara Bals and Van Tendeloo, Gustaaf}
}
@article {1793,
	title = {An alternative approach for ζ-factor measurement using pure element nanoparticles},
	journal = {Ultramicroscopy},
	volume = {164},
	year = {2016},
	pages = {11{\textendash}16},
	abstract = {It is very challenging to measure the chemical composition of hetero nanostructures in a reliable and quantitative manner. Here, we propose a novel and straightforward approach that can be used to quantify energy dispersive X-ray spectra acquired in a transmission electron microscope. Our method is based on a combination of electron tomography and the so-called ζ-factor technique. We will demonstrate the reliability of our approach as well as its applicability by investigating Au-Ag and Au-Pt hetero nanostructures. Given its simplicity, we expect that the method could become a new standard in the field of chemical characterization using electron microscopy.},
	keywords = {Bimetallic nanoparticles, EDXS quantification, Electron tomography},
	issn = {03043991},
	doi = {10.1016/j.ultramic.2016.03.002},
	url = {http://linkinghub.elsevier.com/retrieve/pii/S0304399116300134},
	author = {Daniele Zanaga and Thomas Altantzis and Jonathan Sanctorum and Bert Freitag and Sara Bals}
}
@conference {1741,
	title = {Investigating lattice strain in Au nanodecahedrons},
	year = {2016},
	doi = {10.1002/9783527808465.EMC2016.5519},
	author = {Bart Goris and Jan De Beenhouwer and Annick De Backer and Daniele Zanaga and Kees Joost Batenburg and Ana S{\'a}nchez-Iglesias and Luis M Liz-Marzán and Sandra Van Aert and Jan Sijbers and Van Tendeloo, Gustaaf and Sara Bals}
}
@article {1674,
	title = {Quantitative 3D analysis of huge nanoparticle assemblies.},
	journal = {Nanoscale},
	volume = {8},
	year = {2016},
	month = {2016 Jan 7},
	pages = {292-9},
	abstract = {Nanoparticle assemblies can be investigated in 3 dimensions using electron tomography. However, it is not straightforward to obtain quantitative information such as the number of particles or their relative position. This becomes particularly difficult when the number of particles increases. We propose a novel approach in which prior information on the shape of the individual particles is exploited. It improves the quality of the reconstruction of these complex assemblies significantly. Moreover, this quantitative Sparse Sphere Reconstruction approach yields directly the number of particles and their position as an output of the reconstruction technique, enabling a detailed 3D analysis of assemblies with as many as 10,000 particles. The approach can also be used to reconstruct objects based on a very limited number of projections, which opens up possibilities to investigate beam sensitive assemblies where previous reconstructions with the available electron tomography techniques failed.},
	issn = {2040-3372},
	doi = {10.1039/c5nr06962a},
	author = {Daniele Zanaga and Folkert Bleichrodt and Thomas Altantzis and Winckelmans, Naomi and Willem Jan Palenstijn and Jan Sijbers and de Nijs, Bart and Marijn A van Huis and Ana S{\'a}nchez-Iglesias and Luis M Liz-Marzán and van Blaaderen, Alfons and Kees Joost Batenburg and Sara Bals and Van Tendeloo, Gustaaf}
}
@article {1580,
	title = {The ASTRA Toolbox: a platform for advanced algorithm development in electron tomography},
	journal = {Ultramicroscopy},
	volume = {157},
	year = {2015},
	pages = {35{\textendash}47},
	doi = {10.1016/j.ultramic.2015.05.002},
	author = {Wim Van Aarle and Willem Jan Palenstijn and Jan De Beenhouwer and Thomas Altantzis and Sara Bals and Kees Joost Batenburg and Jan Sijbers}
}
@article {1611,
	title = {Measuring Lattice Strain in Three Dimensions through Electron Microscopy},
	journal = {Nano Letters},
	volume = {15},
	year = {2015},
	pages = {6996{\textendash}7001},
	doi = {10.1021/acs.nanolett.5b03008},
	author = {Bart Goris and Jan De Beenhouwer and Annick De Backer and Daniele Zanaga and Kees Joost Batenburg and Ana S{\'a}nchez-Iglesias and Luis M Liz-Marzán and Sandra Van Aert and Sara Bals and Jan Sijbers and Van Tendeloo, Gustaaf}
}
@article {1496,
	title = {Pore REconstruction and Segmentation (PORES) method for improved porosity quantification of nanoporous materials},
	journal = {Ultramicroscopy},
	volume = {148},
	year = {2015},
	pages = {10-19},
	abstract = {Electron tomography is currently a versatile tool to investigate the connection between the structure and properties of nanomaterials. However, a quantitative interpretation of electron tomography results is still far from straightforward. Especially accurate quantification of pore-space is hampered by artifacts introduced in all steps of the processing chain, i.e., acquisition, reconstruction, segmentation and quantification. Furthermore, most common approaches require subjective manual user input. In this paper, the PORES algorithm ({\textquotedblleft}POre REconstruction and Segmentation{\textquotedblright}) is introduced; it is a tailor-made, integral approach, for the reconstruction, segmentation, and quantification of porous nanomaterials. The PORES processing chain starts by calculating a reconstruction with a nanoporous-specific reconstruction algorithm: the Simultaneous Update of Pore Pixels by iterative REconstruction and Simple Segmentation algorithm (SUPPRESS). It classifies the interior region to the pores during reconstruction, while reconstructing the remaining region by reducing the error with respect to the acquired electron microscopy data. The SUPPRESS reconstruction can be directly plugged into the remaining processing chain of the PORES algorithm, resulting in accurate individual pore quantification and full sample pore statistics. The proposed approach was extensively validated on both simulated and experimental data, indicating its ability to generate accurate statistics of nanoporous materials.},
	doi = {10.1016/j.ultramic.2014.08.008},
	author = {Van Eyndhoven, Geert and Mert Kurttepeli and C. J. {Van Oers} and Pegie Cool and Sara Bals and Kees Joost Batenburg and Jan Sijbers}
}
@article {1626,
	title = {Quantitative 3D analysis of huge nanoparticle assemblies},
	journal = {Nanoscale},
	volume = {8},
	year = {2015},
	pages = {292-299},
	doi = {10.1039/C5NR06962A},
	author = {Daniele Zanaga and Folkert Bleichrodt and Thomas Altantzis and Winckelmans, Naomi and Willem Jan Palenstijn and Jan Sijbers and B. van Nijs and Marijn A van Huis and van Blaaderen, Alfons and Ana S{\'a}nchez-Iglesias and Luis M Liz-Marzán and Kees Joost Batenburg and Sara Bals and Van Tendeloo, Gustaaf}
}
@conference {1454,
	title = {Reliable Pore-size Measurements Based on a Procedure Specifically Designed for Electron Tomography Measurements of Nanoporous Samples},
	year = {2014},
	author = {Van Eyndhoven, Geert and Kees Joost Batenburg and Cynthia Van Oers and Mert Kurttepeli and Sara Bals and Pegie Cool and Jan Sijbers}
}
@article {1343,
	title = {Advanced reconstruction algorithms for electron tomography: from comparison to combination},
	journal = {Ultramicroscopy},
	volume = {127},
	year = {2013},
	pages = {40{\textendash}47},
	author = {Bart Goris and Roelandts, Tom and Kees Joost Batenburg and Hamed Heidari Mezerji and Sara Bals}
}
@article {1320,
	title = {Accurate segmentation of dense nanoparticles by partially discrete electron tomography},
	journal = {Ultramicroscopy},
	volume = {114},
	year = {2012},
	pages = {96-105},
	author = {Roelandts, Tom and Kees Joost Batenburg and E. Biermans and C. Kubel and Sara Bals and Jan Sijbers}
}
@conference {1204,
	title = {Ultra-High Resolution Electron Tomography for Materials Science: A Roadmap},
	year = {2011},
	address = {Nashville, TN, United States},
	doi = {http://dx.doi.org/10.1017/S143192761100554X},
	author = {Kees Joost Batenburg and Sara Bals and Sandra Van Aert and Roelandts, Tom and Jan Sijbers}
}
@conference {1203,
	title = {Partially Discrete Tomography for the Reconstruction of Dense Particles},
	year = {2010},
	pages = {I7.19},
	address = {Rio de Janeiro, Brazil},
	author = {Roelandts, Tom and Kees Joost Batenburg and E. Biermans and Sara Bals and Jan Sijbers}
}
@article {jbatenbuBalsjsijbersKubelMidgleyHernandezKaiserEncinaCoronadoTendeloo2009,
	title = {3D imaging of nanomaterials by discrete tomography},
	journal = {Ultramicroscopy},
	volume = {109},
	year = {2009},
	pages = {730-740},
	doi = {10.1016/j.ultramic.2009.01.009},
	author = {Kees Joost Batenburg and Sara Bals and Jan Sijbers and C. Kubel and P.A. Midgley and J.C. Hernandez and U. Kaiser and E.R. Encina and E.A. Coronado and Van Tendeloo, Gustaaf}
}
@article {BalsjbatenbuVerbeeckjsijbersTendeloo2007,
	title = {Quantitative three-dimensional reconstruction of catalyst particles for bamboo-like carbon nanotubes},
	journal = {Nano Letters},
	volume = {7},
	number = {12},
	year = {2007},
	pages = {3669-3674},
	doi = {10.1021/nl071899m},
	author = {Sara Bals and Kees Joost Batenburg and Jo Verbeeck and Jan Sijbers and Van Tendeloo, Gustaaf}
}
