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Toward denoising of 3D CT scans with few data
Publication Type:
Conference Paper
Authors:
Liang, Zhihua
;
Anneke Van Heteren
;
Jan Sijbers
;
Jan De Beenhouwer
Source:
e-Journal of Nondestructive Testing, Volume 28, Issue 3 (2023)
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Research area:
X-ray imaging
Tomography