Publications

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M. Froeling, Strijkers, G. J., Jeurissen, B., van der Paardt, M., Stoker, J., Nicolay, K., Nederveen, A. J., and Leemans, A., “Fiber architecture of the female pelvic floor: An exploratory investigation using different diffusion MRI tractography algorithms”, ISMRM, 19th Scientific Meeting and Exhibition. Montreal, Canada, 2011.
N. Francken, Paramonov, P., Sijbers, J., and De Beenhouwer, J., “Edge Illumination Phase Contrast Simulations Using the OptiX GPU Ray Tracing Engine”, 5th International Conference on Tomography of Materials & Structures (ICTMS). 2022.
N. J. Forde, Scanlon, C., Emsell, L., O'Donoghue, S., Chaddock, C., Leemans, A., Jeurissen, B., Cannon, D. M., Murray, R. M., and McDonald, C., “Structural brain network analysis in families multiply affected with bipolar 1 disorder”, International Review of Psychosis & Bipolarity. Athens, Greece, 2014.
N. J. Forde, Ellison-Wright, I., Nathan, P. J., Zaman, R., Dudas, R., Agius, M., Fernandez-Egea, E., Leemans, A., Jeurissen, B., Scanlon, C., McDonald, C., and Cannon, D. M., “White Matter Tract Deficits in Schizophrenia”, Neuroscience Ireland Conference, vol. 7. Dublin, Ireland, 2011.
J. Fatermans, Van Aert, S., and den Dekker, A. J., “Bayesian model-order selection in electron microscopy to detect atomic columns in noisy images”, RBSM 2016, Brussels, Belgium. p. 53, 2016.
J. Fatermans, Müller-Caspary, K., den Dekker, A. J., and Van Aert, S., “Detection of atomic columns from noisy STEM images”, Microscopy Conference 2017 (MC 2017), Lausanne, Switzerland. pp. 445-446, 2017.
J. Fatermans, den Dekker, A. J., Müller-Caspary, K., Lobato, I., and Van Aert, S., “Bayesian analysis of noisy scanning transmission electron microscopy images for single atom detection”, SCANDEM 2018, Technical University of Denmark, Kgs. Lyngby, Denmark. p. 95, 2018.
J. Fatermans, den Dekker, A. J., Müller-Caspary, K., Lobato, I., and Van Aert, S., “The maximum a posteriori probability rule to detect single atoms from low signal-to-noise ratio scanning transmission electron microscopy images”, IMC19, Sydney, Australia. 2018.
J. Fatermans, den Dekker, A. J., O'Leary, C. M., Nellist, P. D., and Van Aert, S., “Atom column detection from STEM images using the maximum a posteriori probability rule”, MC 2019, Berlin, Germany. 2019.
J. Fatermans, den Dekker, A. J., and Van Aert, S., “Atom detection from electron microscopy images”, RBSM 2019, Louvain-la-Neuve, Belgium. p. 15, 2019.
J. Fatermans, den Dekker, A. J., Gauquelin, N., Verbeeck, J., and Van Aert, S., “Bayesian model selection for atom column detection from ABF-ADF STEM images”, Virtual Early Career EMC 2020 (online), Copenhagen, Denmark. 2020.