Publications

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2023
J. Sijbers, De Beenhouwer, J., Ling, Y. - T., and Vandervorst, W., “A reconstruction method for atom probe tomography”, U.S. Patent 180175752023.
2017
J. Sijbers and De Beenhouwer, J., “Mobile imaging of an object using penetrating radiation”, U.S. Patent WO/2017/1783342017.
2016
M. Van Dael, Verboven, P., Nicolai, B., Dhaene, J., Van Hoorebeke, L., and Sijbers, J., “Automated quality control and selection ”, U.S. Patent PCT/EP2016/0557182016.
2015
T. De Schryver, Dierick, M., Van Hoorebeke, L., Verboven, P., Van Dael, M., and Sijbers, J., “Tomography for in-line product inspection”, U.S. Patent EP3106863A12015.
T. De Schryver, Dierick, M., Van Hoorebeke, L., Verboven, P., Van Dael, M., and Sijbers, J., “Tomography for in-line product inspection”, U.S. Patent EP3106863A12015.