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Van Dyck, D., A J. den Dekker, J. Sijbers, and E. Bettens, "Dose Limited Resolution", Proceedings Microscopy and Microanalysis, vol. 2, no. 2, Atlanta, Georgia, U.S.A, pp. 802-803, July, 1998.
Bettens, E., A J. den Dekker, J. Sijbers, and D. Van Dyck, "Ultimate resolution in the framework of parameter estimation", IASTED International Conference - Signal and Image Processing (SIP'98), Las Vegas, Nevada, USA, pp. 229-233, October, 1998.
Bettens, E., P. Scheunders, J. Sijbers, D. Van Dyck, and L. Moens, "Automatic segmentation and modeling of two-dimensional electrophoresis gels", Proceedings of IEEE International Conference on Image Processing, vol. 2, Lausanne, Switserland, pp. 665-668, September, 1996.