Publications

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Book Chapter
A. J. den Dekker and Sijbers, J., “Advanced Image Processing in Magnetic Resonance Imaging”, in Series: Signal Processing and Communications, vol. 27, L. Landini, Ed. Marcel Dekker, 2005, pp. 85-143.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., “Chapter Eight - General conclusions and future perspectives”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., “Chapter Five - Optimal experiment design for nanoparticle atom counting from ADF STEM images”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., “Chapter Four - Atom counting”, in Advances in Imaging and Electron Physics,, vol. 217, Science Direct Elsevier, 2021.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., “Chapter One - Introduction”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
J. Fatermans, De Backer, A., den Dekker, A. J., and Van Aert, S., “Chapter Seven - Image-quality evaluation and model selection with maximum a posteriori probability”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
J. Fatermans, De Backer, A., den Dekker, A. J., and Van Aert, S., “Chapter Six - Atom column detection”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., “Chapter Three - Efficient fitting algorithm”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., “Chapter Two - Statistical parameter estimation theory: principles and simulation studies”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
D. Van Dyck, Bettens, E., Sijbers, J., den Dekker, A. J., van den Bos, A., Op de Beeck, M., Jansen, J., and Zandbergen, H., “Resolving atoms: what do we have? what do we want?”, in Institute of Physics Conference Series, vol. 153, J. M. Rodenburg, Ed. Cambridge, UK: Institute of Physics Ltd, 1997, pp. 95-100.
Conference Abstract
S. Van Aert, De Backer, A., De wael, A., Fatermans, J., Friedrich, T., Lobato, I., O'Leary, C. M., Varambhia, A., Altantzis, T., Jones, L., den Dekker, A. J., Nellist, P. D., and Bals, S., “3D Atomic Scale Quantification of Nanostructures and their Dynamics Using Model-based STEM”, Microscopy & Microanalysis 2020 (online), Milwaukee, United States. 2020.
P. Bladt, den Dekker, A. J., Clement, P., Achten, E., and Sijbers, J., “Absolute CBF quantification in multi-time point ASL: the T1 issue”, 10th Annual Meeting of ISMRM Benelux, January 26th 2018, Antwerp, Belgium. 2018.
B. Shafieizargar, Jeurissen, B., Poot, D. H. J., Van Audekerke, J., Verhoye, M., den Dekker, A. J., and Sijbers, J., “Accelerated multi-shot diffusion weighted imaging with joint estimation of diffusion and phase parameters”, Magn Reson Mater Phy, vol. 34. pp. S57-S58, 2021.
G. Ramos-Llordén, Beirinckx, Q., den Dekker, A. J., and Sijbers, J., “Accurate and precise MRI relaxometry: the often disregarded but critical role of statistical parameter estimation”, Proceedings of the International Society for Magnetic Resonance in Medicine (ISMRM), 26th Annual Meeting. Paris, France, p. 5664, 2018.
J. Fatermans, den Dekker, A. J., O'Leary, C. M., Nellist, P. D., and Van Aert, S., “Atom column detection from STEM images using the maximum a posteriori probability rule”, MC 2019, Berlin, Germany. 2019.
J. Fatermans, den Dekker, A. J., and Van Aert, S., “Atom detection from electron microscopy images”, RBSM 2019, Louvain-la-Neuve, Belgium. p. 15, 2019.
J. Fatermans, den Dekker, A. J., Müller-Caspary, K., Lobato, I., and Van Aert, S., “Bayesian analysis of noisy scanning transmission electron microscopy images for single atom detection”, SCANDEM 2018, Technical University of Denmark, Kgs. Lyngby, Denmark. p. 95, 2018.
J. Fatermans, den Dekker, A. J., Gauquelin, N., Verbeeck, J., and Van Aert, S., “Bayesian model selection for atom column detection from ABF-ADF STEM images”, Virtual Early Career EMC 2020 (online), Copenhagen, Denmark. 2020.
J. Fatermans, Van Aert, S., and den Dekker, A. J., “Bayesian model-order selection in electron microscopy to detect atomic columns in noisy images”, RBSM 2016, Brussels, Belgium. p. 53, 2016.
P. Bladt, van Osch, M. J. P., Achten, E., den Dekker, A. J., and Sijbers, J., “Beyond the consensus: is sacrificing part of the PCASL scan time for measurement of labeling efficiency and T1 of blood beneficial?”, University of Michigan international workshop on arterial spin labeling MRI: technical updates and clinical experience, March 9-10 2019, Ann Arbor, USA. 2019.PDF icon Download abstract (1.31 MB)
P. Bladt, van Osch, M. J. P., Achten, E., den Dekker, A. J., and Sijbers, J., “Beyond the consensus: should measurement of T1 of blood and labeling efficiency be included and should a single- or multi-PLD protocol be used in a five-minute protocol for PCASL?”, 11th Annual Meeting of ISMRM Benelux, January 17th 2019, Leiden, The Netherlands. 2019.
P. Bladt, van Osch, M. J. P., Achten, E., den Dekker, A. J., and Sijbers, J., “Beyond the consensus: what to include when 5 minutes are available for perfusion imaging by PCASL?”, 27th Annual Meeting of ISMRM, Montreal, Canada. 2019.
Q. Collier, Veraart, J., den Dekker, A. J., Jeurissen, B., and Sijbers, J., “CSF partial volume modeling in diffusion kurtosis imaging: a comparative parameter estimation study”, Front. Neuroinform. Conference Abstract: Second Belgian Neuroinformatics Congress. 2015.
E. Ribeiro Sabidussi, Nicastro, M., Bazrafkan, S., Beirinckx, Q., Jeurissen, B., Sijbers, J., den Dekker, A. J., Klein, S., and Poot, D. H. J., “A deep learning approach to T1 mapping in quantitative MRI”, 36th Annual Scientific Meeting of the European Society for Magnetic Resonance in Medicine & Biology (ESMRMB), Rotterdam, The Netherlands, vol. 32 (Suppl. 1). Magn Reson Mater Phy, 2019.
J. Fatermans, Müller-Caspary, K., den Dekker, A. J., and Van Aert, S., “Detection of atomic columns from noisy STEM images”, Microscopy Conference 2017 (MC 2017), Lausanne, Switzerland. pp. 445-446, 2017.

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