Publications

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Journal Article
J. Sanctorum, De Beenhouwer, J., and Sijbers, J., X-ray phase contrast simulation for grating-based interferometry using GATE, Optics Express, vol. 28, no. 22, pp. 33390-33412, 2020.PDF icon Download paper (2.5 MB)
B. Fröhler, Elberfeld, T., Möller, T., Weissenböck, J., De Beenhouwer, J., Sijbers, J., Hege, H. - C., Kastner, J., and Heinzl, C., A Visual Tool for the Analysis of Algorithms for Tomographic Fiber Reconstruction in Materials Science, Computer Graphics Forum, vol. 38, no. 3, pp. 273-283, 2019.
S. Bazrafkan, Van Nieuwenhove, V., Soons, J., De Beenhouwer, J., and Sijbers, J., To Recurse or not to Recurse A Low Dose CT Study, Progress in Artificial Intelligence, In Press.
A. Könik, De Beenhouwer, J., Mukherjee, J. M., Kalluri, K., Banerjee, S., Zeraatkar, N., Fromme, T. J., and King, M. A., Simulations of a Multipinhole SPECT Collimator for Clinical Dopamine Transporter (DAT) Imaging, IEEE Transactions on Radiation and Plasma Medical Sciences, vol. 2, pp. 444-451, 2018.
B. Auer, Kalluri, K., De Beenhouwer, J., Doty, K., Zeraatkar, N., Kuo, P. H., Furenlid, L. R., and King, M. A., Reconstruction using Depth of Interaction Information of Curved and Flat Detector Designs for Quantitative Multi-Pinhole Brain SPECT, Journal of Nuclear Medicine, vol. 61, p. 103, 2020.PDF icon snm2020_recon_curved.pdf (103.23 KB)
J. Sanctorum, Van Wassenbergh, S., Nguyen, V., De Beenhouwer, J., Sijbers, J., and Dirckx, J. J. J., Projection-angle-dependent distortion correction in high-speed image-intensifier-based x-ray computed tomography, Measurement Science and Technology, In Press.
A. Könik, Auer, B., De Beenhouwer, J., Kalluri, K., Zeraatkar, N., Furenlid, L. R., and King, M. A., Primary, scatter, and penetration characterizations of parallel-hole and pinhole collimators for I-123 SPECT, Physics in Medicine & Biology, vol. 64, no. 24, p. 245001, 2019.PDF icon i123_spectra_final_revision_11_7_19.pdf (7.63 MB)
N. Six, De Beenhouwer, J., and Sijbers, J., poly-DART: A discrete algebraic reconstruction technique for polychromatic X-ray CT, Optics Express, vol. 27, no. 23, pp. 33427-33435, 2019.PDF icon Download paper (997.08 KB)
T. Elberfeld, De Beenhouwer, J., den Dekker, A. J., Heinzl, C., and Sijbers, J., Parametric Reconstruction of Glass Fiber-reinforced Polymer Composites from X-ray Projection Data - A Simulation Study, Journal of Nondestructive Evaluation, vol. 37, no. 62, pp. 1573-4862, 2018.
T. Van De Looverbosch, Bhuiyan, H. Rahman, Verboven, P., Dierick, M., Van Loo, D., De Beenhouwer, J., Sijbers, J., and Nicolai, B., Nondestructive internal quality inspection of pear fruit by X-ray CT using machine learning, Food Control, vol. 113, no. 107170, pp. 1-13, 2020.
H. K. Jenssen, Oberlander, B. C., De Beenhouwer, J., Sijbers, J., and Verwerft, M., Neutron radiography and tomography applied to fuel degradation during ramp tests and loss of coolant accident tests in a research reactor, Progress in Nuclear Energy, vol. 72, pp. 55-62, 2014.
E. Janssens, De Beenhouwer, J., Van Dael, M., De Schryver, T., Van Hoorebeke, L., Verboven, P., Nicolai, B., and Sijbers, J., Neural network Hilbert transform based filtered backprojection for fast inline X-ray inspection, Measurement Science and Technology, vol. 29, no. 3, 2018.PDF icon Download paper (3.4 MB)
V. Van Nieuwenhove, De Beenhouwer, J., Vlassenbroeck, J., Brennan, M., and Sijbers, J., MoVIT: A tomographic reconstruction framework for 4D-CT, Optics Express, vol. 25, no. 16, pp. 19236-19250, 2017.
B. Goris, De Beenhouwer, J., De Backer, A., Zanaga, D., Batenburg, K. J., Sánchez-Iglesias, A., Liz-Marzán, L. M., Van Aert, S., Bals, S., Sijbers, J., and Van Tendeloo, G., Measuring Lattice Strain in Three Dimensions through Electron Microscopy, Nano Letters, vol. 15, no. 10, pp. 6996–7001, 2015.
B. G. Booth, Sijbers, J., and De Beenhouwer, J., A Machine Learning Approach to Growth Direction Finding for Automated Planting of Bulbous Plants, Scientific Reports, vol. 10, no. 661, 2020.
V. Nguyen, De Beenhouwer, J., Sanctorum, J., Van Wassenbergh, S., Bazrafkan, S., Dirckx, J. J. J., and Sijbers, J., A low-cost geometry calibration procedure for a modular cone-beam X-ray CT system, Nondestructive Testing and Evaluation , vol. 35, no. 3, pp. 252-265, 2020.
V. Van Nieuwenhove, Van Eyndhoven, G., Batenburg, K. J., Buls, N., Vandemeulebroucke, J., De Beenhouwer, J., and Sijbers, J., Local Attenuation Curve Optimization (LACO) framework for high quality perfusion maps in low-dose cerebral perfusion CT, Medical Physics, vol. 43, no. 12, pp. 6429-6438, 2016.
B. Auer, Kalluri, K., De Beenhouwer, J., Zeraatkar, N., Momsen, N., Kuo, P. H., Furenlid, L. R., and King, M. A., Keel-Edge Height Selection for Improved Multi-Pinhole 123I Brain SPECT Imaging, Journal of Nuclear Medicine, vol. 61, p. 573, 2020.PDF icon Download paper (127.73 KB)
E. Janssens, Pelt, D., De Beenhouwer, J., Van Dael, M., Verboven, P., Nicolai, B., and Sijbers, J., Fast Neural Network Based X-Ray Tomography of Fruit on a Conveyor Belt, Chemical Engineering Transactions, vol. 44, pp. 181-186, 2015.
E. Janssens, Alves Pereira, L. F., De Beenhouwer, J., Tsang, I. R., Van Dael, M., Verboven, P., Nicolai, B., and Sijbers, J., Fast inline inspection by neural network based filtered backprojection: Application to apple inspection, Case Studies in Nondestructive Testing and Evaluation, vol. 6, pp. 14–20, 2016.PDF icon Download paper (726.63 KB)
W. Van Aarle, Palenstijn, W. J., Cant, J., Janssens, E., Bleichrodt, F., Dabravolski, A., De Beenhouwer, J., Batenburg, K. J., and Sijbers, J., Fast and Flexible X-ray Tomography Using the ASTRA Toolbox, Optics Express, vol. 24, pp. 25129-25147, 2016.PDF icon Download paper (8.34 MB)

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