Publications

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Book Chapter
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., Chapter Eight - General conclusions and future perspectives, in Advances in Imaging and Electron Physics, vol. 216, Science Direct Elsevier, In Press.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., Chapter Five - Optimal experiment design for nanoparticle atom counting from ADF STEM images, in Advances in Imaging and Electron Physics, vol. 216, Science Direct Elsevier, In Press.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., Chapter Four - Atom counting, in Advances in Imaging and Electron Physics,, vol. 216, Science Direct Elsevier, In Press.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., Chapter One - Introduction, in Advances in Imaging and Electron Physics, vol. 216, Science Direct Elsevier, In Press.
J. Fatermans, De Backer, A., den Dekker, A. J., and Van Aert, S., Chapter Seven - Image-quality evaluation and model selection with maximum a posteriori probability, in Advances in Imaging and Electron Physics, vol. 216, Science Direct Elsevier, In Press.
J. Fatermans, De Backer, A., den Dekker, A. J., and Van Aert, S., Chapter Six - Atom column detection, in Advances in Imaging and Electron Physics, vol. 216, Science Direct Elsevier, In Press.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., Chapter Three - Efficient fitting algorithm, in Advances in Imaging and Electron Physics, vol. 216, Science Direct Elsevier, In Press.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., Chapter Two - Statistical parameter estimation theory: principles and simulation studies, in Advances in Imaging and Electron Physics, vol. 216, Science Direct Elsevier, In Press.
Conference Abstract
S. Van Aert, De Backer, A., De wael, A., Fatermans, J., Friedrich, T., Lobato, I., O'Leary, C. M., Varambhia, A., Altantzis, T., Jones, L., den Dekker, A. J., Nellist, P. D., and Bals, S., 3D Atomic Scale Quantification of Nanostructures and their Dynamics Using Model-based STEM, Microscopy & Microanalysis 2020 (online), Milwaukee, United States. 2020.
J. Fatermans, den Dekker, A. J., O'Leary, C. M., Nellist, P. D., and Van Aert, S., Atom column detection from STEM images using the maximum a posteriori probability rule, MC 2019, Berlin, Germany. 2019.
J. Fatermans, den Dekker, A. J., and Van Aert, S., Atom detection from electron microscopy images, RBSM 2019, Louvain-la-Neuve, Belgium. p. 15, 2019.
J. Fatermans, den Dekker, A. J., Müller-Caspary, K., Lobato, I., and Van Aert, S., Bayesian analysis of noisy scanning transmission electron microscopy images for single atom detection, SCANDEM 2018, Technical University of Denmark, Kgs. Lyngby, Denmark. p. 95, 2018.
J. Fatermans, den Dekker, A. J., Gauquelin, N., Verbeeck, J., and Van Aert, S., Bayesian model selection for atom column detection from ABF-ADF STEM images, Virtual Early Career EMC 2020 (online), Copenhagen, Denmark. 2020.
J. Fatermans, Van Aert, S., and den Dekker, A. J., Bayesian model-order selection in electron microscopy to detect atomic columns in noisy images, RBSM 2016, Brussels, Belgium. p. 53, 2016.
J. Fatermans, Müller-Caspary, K., den Dekker, A. J., and Van Aert, S., Detection of atomic columns from noisy STEM images, Microscopy Conference 2017 (MC 2017), Lausanne, Switzerland. pp. 445-446, 2017.
B. Goris, De Beenhouwer, J., De Backer, A., Zanaga, D., Batenburg, K. J., Sánchez-Iglesias, A., Liz-Marzán, L. M., Van Aert, S., Sijbers, J., Van Tendeloo, G., and Bals, S., Investigating lattice strain in Au nanodecahedrons, European Microscopy Congress 2016. 2016.
S. Van Aert, Fatermans, J., De Backer, A., van den Bos, K. H. W., O'Leary, C. M., Müller-Caspary, K., Jones, L., Lobato, I., Béché, A., den Dekker, A. J., Bals, S., and Nellist, P. D., Maximising dose efficiency in quantitative STEM to reveal the 3D atomic structure of nanomaterials, IMC19, Sydney, Australia. 2018.
J. Fatermans, den Dekker, A. J., Müller-Caspary, K., Lobato, I., and Van Aert, S., The maximum a posteriori probability rule to detect single atoms from low signal-to-noise ratio scanning transmission electron microscopy images, IMC19, Sydney, Australia. 2018.
S. Van Aert, De wael, A., Fatermans, J., Lobato, I., De Backer, A., Jones, L., den Dekker, A. J., and Nellist, P. D., Quantifying 3D atomic structures of nanomaterials and their dynamics using model-based scanning transmission electron microscopy, Spring Meeting of the EMRS, Nice, France. 2019.
S. Van Aert, De wael, A., Fatermans, J., Lobato, I., De Backer, A., Jones, L., den Dekker, A. J., and Nellist, P. D., Strategies for quantifying 3D atomic structures of nanomaterials and their dynamics using dose-efficient ADF STEM, PICO2019, Vaalsbroek, The Netherlands. 2019.
S. Van Aert, De Backer, A., De wael, A., Fatermans, J., E Irmak, A., Friedrich, T., Lobato, I., Jones, L., den Dekker, A. J., Nellist, P. D., and Bals, S., Strategies for quantifying the 3D atomic structure and the dynamics of nanomaterials using model-based STEM, Virtual MRS Spring/ Fall Meeting, Boston, United States (online). 2020.
K. J. Batenburg, Bals, S., Van Aert, S., Roelandts, T., and Sijbers, J., Ultra-High Resolution Electron Tomography for Materials Science: A Roadmap, Microscopy and Microanalysis 2011 Meeting. Nashville, TN, United States, 2011.

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