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2019
Nguyen, V., J. De Beenhouwer, J. Sanctorum, S. Van Wassenbergh, P. Aerts, J. J. J. Dirckx, and J. Sijbers, "A low-cost and easy-to-use phantom for cone-beam geometry calibration of a tomographic X-ray system", 9th Conference on Industrial Computed Tomography, Padova, Italy, 2019. PDF icon Download paper (1.93 MB)
Sanctorum, J., D. Adriaens, J. J. J. Dirckx, J. Sijbers, C. Van Ginneken, P. Aerts, and S. Van Wassenbergh, "Methods for characterization and optimisation of measuring performance of stereoscopic x-ray systems with image intensifiers", Measurement Science and Technology, vol. 30, issue 10, 2019.