Publications

Export 6 results:
Author [ Type(Asc)] Year
Filters: Author is Ivan Lobato  [Clear All Filters]
Conference Abstract
Van Aert, S., A. De wael, J. Fatermans, I. Lobato, A. De Backer, L. Jones, A J. den Dekker, and P. D. Nellist, "Strategies for quantifying 3D atomic structures of nanomaterials and their dynamics using dose-efficient ADF STEM", PICO2019, Vaalsbroek, The Netherlands, 2019.
Van Aert, S., A. De wael, J. Fatermans, I. Lobato, A. De Backer, L. Jones, A J. den Dekker, and P. D. Nellist, "Quantifying 3D atomic structures of nanomaterials and their dynamics using model-based scanning transmission electron microscopy", Spring Meeting of the EMRS, Nice, France, 2019.
Fatermans, J., A J. den Dekker, K. Müller-Caspary, I. Lobato, and S. Van Aert, "The maximum a posteriori probability rule to detect single atoms from low signal-to-noise ratio scanning transmission electron microscopy images", IMC19, Sydney, Australia, 2018.
Van Aert, S., J. Fatermans, A. De Backer, K.. H. W. van den Bos, C. M. O'Leary, K. Müller-Caspary, L. Jones, I. Lobato, A. Béché, A J. den Dekker, et al., "Maximising dose efficiency in quantitative STEM to reveal the 3D atomic structure of nanomaterials", IMC19, Sydney, Australia, 2018.
Fatermans, J., A J. den Dekker, K. Müller-Caspary, I. Lobato, and S. Van Aert, "Bayesian analysis of noisy scanning transmission electron microscopy images for single atom detection", SCANDEM 2018, Technical University of Denmark, Kgs. Lyngby, Denmark, pp. 95, 2018.