Publications

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Conference Abstract
J. Merckx, van Lith, B., Sijbers, J., and De Beenhouwer, J., “Adaptive triangular mesh for phase contrast imaging”, 5th international Conference on Tomography of Materials & Structures, 27the June - 1ste July, Grenoble, France. 2022.
V. Van Nieuwenhove, Van Eyndhoven, G., De Beenhouwer, J., and Sijbers, J., “Compensation of affine deformations in fan and cone beam projections”, Micro-CT User Meeting. pp. 187-189, 2014.PDF icon Download abstract (285.55 KB)
J. Rimpelainen, Bazrafkan, S., Sijbers, J., and De Beenhouwer, J., “Deep learning based missing wedge artefact removal for electron tomography”, Microscopy Conference, Berlin, Germany. pp. 660-661, 2019.
E. Janssens, De Beenhouwer, J., Sanctorum, J., Senck, S., Heinzl, C., and Sijbers, J., “Dual axis Dark Field Contrast Tomography for visualisation of scattering directions in a CFRP sample”, 4th Conference on X-ray and Neutron Phase Imaging with Gratings. Zürich, Switzerland, pp. 79-80, 2017.PDF icon Download poster (729.94 KB)PDF icon Download abstract (116.29 KB)
V. Van Nieuwenhove, De Beenhouwer, J., and Sijbers, J., “A fast 4D CT reconstruction algorithm for affine deforming objects”, Applied inverse problems conference. 2015.
J. De Beenhouwer, Palenstijn, W. J., Bleichrodt, F., Batenburg, K. J., and Sijbers, J., “A framework for markerless alignment with full 3D flexibility”, European Microscopy Conference. 2012.PDF icon Download abstract (117.9 KB)
B. Goris, De Beenhouwer, J., De Backer, A., Zanaga, D., Batenburg, K. J., Sánchez-Iglesias, A., Liz-Marzán, L. M., Van Aert, S., Sijbers, J., Van Tendeloo, G., and Bals, S., “Investigating lattice strain in Au nanodecahedrons”, European Microscopy Congress 2016. 2016.
B. Auer, Kalluri, K., De Beenhouwer, J., Zeraatkar, N., Könik, A., Kuo, P. H., Furenlid, L. R., and King, M. A., “Investigation of keel versus knife edge pinhole profiles for a next-generation SPECT system dedicated to clinical brain imaging”, 2nd International Conference on Monte Carlo Techniques for Medical Applications. 2019.
T. Elberfeld, Bazrafkan, S., De Beenhouwer, J., and Sijbers, J., “Mixed-Scale Dense Convolutional Neural Network based Improvement of Glass Fiber-reinforced Composite CT Images”, 4th International Conference on Tomography of Materials & Structures. 2019.
J. Renders, Nguyen, A. - T., De Beenhouwer, J., and Sijbers, J., “Motion compensating X-ray micro-CT of diamonds in a processing stage”, 31st International Conference on Diamond and Carbon Materials. 2021.
T. Elberfeld, De Beenhouwer, J., den Dekker, A. J., Heinzl, C., and Sijbers, J., “Parametric Reconstruction of Advanced Glass Fiber-reinforced Polymer Composites from X-ray Images”, 8th Conference on Industrial Computed Tomography. Wels, Austria, 2018.PDF icon Download paper (636.09 KB)
C. Bossuyt, De Beenhouwer, J., and Sijbers, J., “Sparse view rectangular X-ray CT for cargo inspection using the ASTRA toolbox”, 5th international Conference on Tomography of Materials & Structures, 27the June - 1ste July, Grenoble, France. 2022.
Y. - T. Ling, Cools, S., De Beenhouwer, J., Sijbers, J., and Vandervorst, W., “A Trajectory Based Bottom-Up Volume Reconstruction Method for Atom Probe Tomography”, European Atom Probe Workshop. 2019.
J. Sanctorum, Janssens, E., den Dekker, A. J., Senck, S., Heinzl, C., De Beenhouwer, J., and Sijbers, J., “A workflow to reconstruct grating-based X-ray phase contrast CT images: application to CFRP samples”, 4th Conference on X-ray and Neutron Phase Imaging with Gratings. Zürich, Switzerland, pp. 139-140, 2017.PDF icon Download poster (1008.67 KB)PDF icon Download abstract (294.87 KB)
Conference Paper
L. - P. Lumbeeck, Paramonov, P., Sijbers, J., and De Beenhouwer, J., “3D THz Tomography Incorporating the Beam Shape”, in 2021 OSA Imaging and Applied Optics Congress, 2021.
A. - T. Nguyen, Renders, J., Soete, J., Wevers, M., Sijbers, J., and De Beenhouwer, J., “An accelerated motion-compensated iterative reconstruction technique for dynamic computed tomography”, in Proc. SPIE 12242, Developments in X-Ray Tomography XIV, 122421F, San Diego, CA, United States, 2022.
P. Paramonov, Lumbeeck, L. - P., De Beenhouwer, J., and Sijbers, J., “Accurate terahertz simulation with ray tracing incorporating beam shape and refraction”, in IEEE ICIP , 2020, pp. 3035-3039.PDF icon Download paper (190.62 KB)
D. Frenkel, De Beenhouwer, J., and Sijbers, J., “An adaptive probability map for the Discrete Algebraic Reconstruction Technique”, in 10th Conference on Industrial Computed Tomography (ICT 2020), 2020, pp. 1-6.
J. Renders, Sijbers, J., and De Beenhouwer, J., “Adjoint pairs of image warping operators for motion modeling in 4D-CT”, in 6th International Conference on Image Formation in X-Ray Computed Tomography, 2020.PDF icon Download paper (617.11 KB)
V. Van Nieuwenhove, De Beenhouwer, J., De Schryver, T., Van Hoorebeke, L., and Sijbers, J., “Affine deformation correction in cone beam Computed Tomography”, in Fully Three-Dimensional Image Reconstruction in Radiology and Nuclear Medicine, Newport, Rhode Island, USA, 2015, pp. 182-185.PDF icon Download paper (2.91 MB)
F. Bleichrodt, De Beenhouwer, J., Sijbers, J., and Batenburg, K. J., “An Alignment Method for Fan Beam Tomography”, in International Conference on Tomography of Materials and Structures (ICTMS), 2013, pp. 103-107.
P. - J. Vanthienen, Sanctorum, J., Huyge, B., Six, N., Sijbers, J., and De Beenhouwer, J., “Alternative grating designs for cone-beam edge illumination X-ray phase contrast imaging”, in Proc. SPIE 12242, Developments in X-Ray Tomography XIV, San Diego, USA, 2022, vol. 12242, p. 122420Z.
B. Fröhler, Elberfeld, T., Möller, T., Hege, H. - C., De Beenhouwer, J., Sijbers, J., Kastner, J., and Heinzl, C., “Analysis and Comparison of Algorithms for the Tomographic Reconstruction of Curved Fibers”, in 10th Conference on Industrial Computed Tomography (ICT 2020), 2020.PDF icon Download paper (703.79 KB)
B. Huyge, Sanctorum, J., Six, N., De Beenhouwer, J., and Sijbers, J., “Analysis of flat fields in edge illumination phase contrast imaging”, in 2021 IEEE 18th International Symposium on Biomedical Imaging (ISBI), Nice, France, 2021, pp. 1310-1313.
D. Iuso, Chatterjee, S., Heylen, R., Cornelissen, S., De Beenhouwer, J., and Sijbers, J., “Analysis of the effectiveness of deeply supervised neural networks for defect segmentation in additive manufacturing”, in SPIE Optical Engineering: Developments in X-Ray Tomography XIV , 2022, vol. 12242, p. 122421K.

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