Publications

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2023
N. Francken, Sanctorum, J., Renders, J., Paramonov, P., Sijbers, J., and De Beenhouwer, J., “A condensed history approach to x-ray dark field effects in edge illumination phase contrast simulations”, in 45th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, 2023.
J. Renders, Shafieizargar, B., Verhoye, M., De Beenhouwer, J., Dekker, A. Jan den, and Sijbers, J., “DELTA-MRI: Direct deformation Estimation from LongiTudinally Acquired k-space data”, in IEEE International Symposium on Biomedical Imaging, 2023.
A. Presenti, Liang, Z., Alves Pereira, L. F., Sijbers, J., and De Beenhouwer, J., “Fast and accurate pose estimation of additive manufactured objects from few X-ray projections”, Expert Systems With Applications, vol. 213, no. 118866, pp. 1-10, 2023.
A. - T. Nguyen, Renders, J., Sijbers, J., and De Beenhouwer, J., “Region-based motion-compensated iterative reconstruction technique for dynamic computed tomography”, in IEEE International Symposium on Biomedical Imaging (ISBI), Cartagena de Indias, Colombia, 2023.PDF icon Download paper (461.16 KB)
L. F. Alves Pereira, De Beenhouwer, J., and Sijbers, J., “Sparse-view Medical Tomosynthesis via Mixed Scale Dense Convolutional Framelet Networks”, in IEEE International Symposium on Biomedical Imaging (ISBI), 2023.
2022
R. Heylen, Thanki, A., Verhees, D., Iuso, D., De Beenhouwer, J., Sijbers, J., Witvrouw, A., Haitjema, H., and Bey-Temsamani, A., “3D total variation denoising in X-CT imaging applied to pore extraction in additively manufactured parts”, Measurement Science and Technology, vol. 33, no. 4, pp. 1-12, 2022.
A. Presenti, “3D X-ray radiography-based inspection of manufactured objects”, 2022.
A. - T. Nguyen, Renders, J., Soete, J., Wevers, M., Sijbers, J., and De Beenhouwer, J., “An accelerated motion-compensated iterative reconstruction technique for dynamic computed tomography”, in Proc. SPIE 12242, Developments in X-Ray Tomography XIV, 122421F, San Diego, CA, United States, 2022.
J. Merckx, van Lith, B., Sijbers, J., and De Beenhouwer, J., “Adaptive triangular mesh for phase contrast imaging”, 5th international Conference on Tomography of Materials & Structures, 27the June - 1ste July, Grenoble, France. 2022.
V. Nguyen, “Advances in biplanar X-ray imaging: calibration and 2D/3D registration”, 2022.PDF icon Download PhD thesis (8.02 MB)
P. - J. Vanthienen, Sanctorum, J., Huyge, B., Six, N., Sijbers, J., and De Beenhouwer, J., “Alternative grating designs for cone-beam edge illumination X-ray phase contrast imaging”, in Proc. SPIE 12242, Developments in X-Ray Tomography XIV, San Diego, USA, 2022, vol. 12242, p. 122420Z.
D. Iuso, Chatterjee, S., Heylen, R., Cornelissen, S., De Beenhouwer, J., and Sijbers, J., “Analysis of the effectiveness of deeply supervised neural networks for defect segmentation in additive manufacturing”, in SPIE Optical Engineering: Developments in X-Ray Tomography XIV , 2022, vol. 12242, p. 122421K.PDF icon Download paper (protected) (1.79 MB)
A. - T. Nguyen, Renders, J., Soete, J., Wevers, M., Sijbers, J., and De Beenhouwer, J., “Analytic derivatives of scaling motion-compensated projection operators for dynamic computed tomography”, in e-Journal of Nondestructive Testing, 2022, vol. 27 (3), pp. 1-5.
J. Sanctorum, Six, N., Sijbers, J., and De Beenhouwer, J., “Augmenting a conventional X-ray scanner with edge illumination based phase contrast imaging: how to design the gratings?”, in Proc. SPIE 12242, Developments in X-Ray Tomography XIV, San Diego, USA, 2022, p. 1224218.
A. Presenti, Liang, Z., Alves Pereira, L. F., Sijbers, J., and De Beenhouwer, J., “Automatic anomaly detection from X-ray images based on autoencoder”, Nondestructive Testing and Evaluation, vol. 37, no. 5, 2022.
V. Nguyen, Alves Pereira, L. F., Liang, Z., Mielke, F., Van Houtte, J., Sijbers, J., and De Beenhouwer, J., “Automatic landmark detection and mapping for 2D/3D registration with BoneNet”, Frontiers Veterinary Science, 2022.PDF icon Download paper (2.51 MB)
Y. - T. Ling, Cools, S., Bogdanowicz, J., Fleischmann, C., De Beenhouwer, J., Sijbers, J., and Vandervorst, W., “A Bottom-Up Volume Reconstruction Method for Atom Probe Tomography”, Microscopy and Microanalysis, vol. 28, no. 4, pp. 1-14, 2022.
A. Presenti, Liang, Z., Alves Pereira, L. F., Sijbers, J., and De Beenhouwer, J., “CNN-based pose estimation from a single X-ray projection for 3D inspection of manufactured objects”, in 11th Conference on Industrial Computed Tomography, 2022.
T. Elberfeld, Fröhler, B., Heinzl, C., Sijbers, J., and De Beenhouwer, J., “cuPARE: Parametric Reconstruction of Curved Fibres from Glass fibre-reinforced Composites”, Nondestructive Testing and Evaluation, 2022.
J. Christopher, Lumbeeck, L. - P., Paramonov, P., De Beenhouwer, J., and Sijbers, J., “Discrete Terahertz tomography: a simulation study ”, in 11th Conference on Industrial Computed Tomography, 2022.
P. Paramonov, Renders, J., Elberfeld, T., De Beenhouwer, J., and Sijbers, J., “Efficient X-ray projection of triangular meshes based on ray tracing and rasterization”, in SPIE Optical Engineering: Developments in X-Ray Tomography XIV , 2022, vol. 12242, p. 122420W .
B. Huyge, Jeurissen, B., De Beenhouwer, J., and Sijbers, J., “Fiber orientation estimation by constrained spherical deconvolution of the anisotropic edge illumination x-ray dark field signal”, in SPIE: Developments in X-Ray Tomography XIV, 2022, vol. 12242, p. 122420V .
N. Six, Renders, J., De Beenhouwer, J., and Sijbers, J., “Joint reconstruction of attenuation, refraction and dark field X-ray phase contrasts using split Barzilai-Borwein steps”, in SPIE Optical Engineering: Developments in X-Ray Tomography XIV , 2022, vol. 12242, p. 122420O.
C. Bossuyt, De Beenhouwer, J., and Sijbers, J., “Optimisation of a multi-source rectangular X-ray CT geometry for inline inspection”, in SPIE Optical Engineering: Developments in X-Ray Tomography XIV , 2022, vol. 12242, p. 1224219 .
M. Yosifov, Reiter, M., Heupl, S., Gusenbauer, C., Fröhler, B., R. Gutierrez, F. -, De Beenhouwer, J., Sijbers, J., Kastner, J., and Heinzl, C., “Probability of Detection applied to X-ray inspection using numerical simulations”, Nondestructive Testing and Evaluation, vol. 37, no. 5, pp. 536-551, 2022.

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