Publications
Conference Abstract
Fatermans, J., A J. den Dekker, K. Müller-Caspary, I. Lobato, and S. Van Aert,
"Bayesian analysis of noisy scanning transmission electron microscopy images for single atom detection",
SCANDEM 2018, Technical University of Denmark, Kgs. Lyngby, Denmark, pp. 95, 2018.
Fatermans, J., K. Müller-Caspary, A J. den Dekker, and S. Van Aert,
"Detection of atomic columns from noisy STEM images",
Microscopy Conference 2017 (MC 2017), Lausanne, Switzerland, pp. 445-446, 2017.
Van Aert, S., J. Fatermans, A. De Backer, K.. H. W. van den Bos, C. M. O'Leary, K. Müller-Caspary, L. Jones, I. Lobato, A. Béché, A J. den Dekker, et al.,
"Maximising dose efficiency in quantitative STEM to reveal the 3D atomic structure of nanomaterials",
IMC19, Sydney, Australia, 2018.
Fatermans, J., A J. den Dekker, K. Müller-Caspary, I. Lobato, and S. Van Aert,
"The maximum a posteriori probability rule to detect single atoms from low signal-to-noise ratio scanning transmission electron microscopy images",
IMC19, Sydney, Australia, 2018.
]