Publications

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2024
J. Lüken, Fleischmann, C., Sijbers, J., and De Beenhouwer, J., AdAPTS: An Adaptive Atom Probe Tomography Simulation Library, Microscopy and Microanalysis, vol. 30, no. 1. 2024.
P. Paramonov, Francken, N., Renders, J., Iuso, D., Elberfeld, T., De Beenhouwer, J., and Sijbers, J., CAD-ASTRA: A versatile and efficient mesh projector for X-ray tomography with the ASTRA-toolbox, Optics Express, vol. 32, no. 3, pp. 3425-3439, 2024.PDF icon Download paper (11.29 MB)
C. Bossuyt, den Dekker, A. J., Iuso, D., Le Hoang, T., Escoda, J., Costin, M., Sijbers, J., and De Beenhouwer, J., Deep image prior for sparse-view reconstruction in static, rectangular multi-source x-ray CT systems for cargo scanning, in SPIE Developments in X-Ray Tomography XV, 2024, vol. 13152.
J. Renders, Mancini, L., De Beenhouwer, J., and Sijbers, J., Direct reconstruction of wet foam from sparse-view, dynamic X-ray CT scans, Advanced Engineering Materials, vol. 2400957, pp. 1-10, 2024.PDF icon Download paper (2.77 MB)
D. Gökbel Keklikoğlu, Francken, N., Huyge, B., Merdan, Z., De Beenhouwer, J., and Sijbers, J., Dynamic flat field correction in edge illumination imaging, in SPIE Developments in X-Ray Tomography XV, 2024, vol. 13152.
N. Francken, Sanctorum, J., Paramonov, P., Sijbers, J., and De Beenhouwer, J., Edge illumination x-ray phase contrast simulations using the CAD-ASTRA toolbox, Optics Express, vol. 32, no. 6, pp. 10005-10021, 2024.
J. Merckx, den Dekker, A. J., De Beenhouwer, J., and Sijbers, J., Fast and efficient tetrahedral volume mesh reconstruction with CAD-ASTRA, in SPIE Developments in X-Ray Tomography XV, San Diego, USA, 2024, vol. 13152.
P. Paramonov, Sanctorum, J. G., Iuso, D., Sijbers, J., and De Beenhouwer, J., High-resolution tiled X-ray cone-beam CT using the ASTRA toolbox, in 13th Conference on Industrial Computed Tomography (iCT) 2024, School of Engineering, Wels Campus, Austria, 2024.PDF icon Download paper (532.89 KB)
J. Deng, Renders, J., Meenaketan, B. Linkoon P., Takalloo, S. Ebrahimi, Braeken, D., De Beenhouwer, J., and Sijbers, J., Imaging Algorithm and Optimal Measurement Protocol for 3D Impedance Tomography on 2D High Density Micro Electrode Array, IEEE Sensors, vol. 24, no. 15, pp. 24452-24465, 2024.
J. Renders, Improved 4DCT reconstruction algorithms for the imaging of foam microstructure formation, 2024.
N. Six, Improved X-ray CT reconstruction techniques with non-linear imaging models, 2024.
N. Francken, Sanctorum, J., Sanctorum, J., Vanthienen, P. - J., Sijbers, J., and De Beenhouwer, J., Inline edge illumination X-ray phase contrast imaging through mask misalignment, Optics Express, vol. 32, no. 18, pp. 32048-32061, 2024.PDF icon Download paper (1.69 MB)
N. Six, Renders, J., De Beenhouwer, J., and Sijbers, J., Joint multi-contrast CT for edge illumination X-ray phase contrast imaging using split Barzilai-Borwein steps, Optics Express, vol. 32, no. 2, pp. 1135-1150, 2024.PDF icon Download paper (13.42 MB)
A. - T. Nguyen, Renders, J., Iuso, D., Maris, Y., Soete, J., Wevers, M., Sijbers, J., and De Beenhouwer, J., MIRT: a simultaneous reconstruction and affine motion compensation technique for four dimensional computed tomography (4DCT). arXiv.org e-Print archive, 2024.PDF icon siam_mirt.pdf (2.85 MB)
D. Iuso, Paramonov, P., De Beenhouwer, J., and Sijbers, J., PACS: Projection-driven with Adaptive CADs X-ray Scatter compensation for additive manufacturing inspection, Precision Engineering, vol. 90, pp. 108-121, 2024.PDF icon Download paper (4.28 MB)
D. Iuso, Paramonov, P., De Beenhouwer, J., and Sijbers, J., Practical multi-mesh registration for few-view poly-chromatic X-ray inspection, Journal of Non-destructive Testing, vol. 43, 2024.PDF icon Download paper (6.94 MB)
A. - T. Nguyen, Renders, J., Sijbers, J., and De Beenhouwer, J., Reconstruction with rigid motion correction technique in CT imaging: A simulation and application study, Workshop on Scientific Computing and Applications. Vietnam Institute for Advanced Study in Mathematics (VIASM), Hanoi, Vietnam, 2024.PDF icon wsca2024.pdf (110.08 KB)PDF icon wsca2024_slides.pdf (2.75 MB)
D. Iuso, Chatterjee, S., Cornelissen, S., Verhees, D., De Beenhouwer, J., and Sijbers, J., Voxel-wise classification for porosity investigation of additive manufactured parts with 3D unsupervised and (deeply) supervised neural models, Applied Intelligence, vol. 54, pp. 13160–13177, 2024.PDF icon Download paper (2.48 MB)
B. Huyge, Renders, J., De Beenhouwer, J., and Sijbers, J., X-ray image reconstruction for continuous acquisition with accelerated rotation, in SPIE Developments in X-Ray Tomography XV, 2024, vol. 13152.
B. Huyge, Renders, J., Sanctorum, J., De Beenhouwer, J., and Sijbers, J., X-ray image reconstruction for continuous acquisitions with a generalized motion model, Optics Express, vol. 32, no. 22, pp. 39192-39207, 2024.
2023
B. Huyge, Vanthienen, P. - J., Six, N., Sijbers, J., and De Beenhouwer, J., Adapting an XCT-scanner to enable edge illumination X-ray phase contrast imaging, in e-Journal of Nondestructive Testing, 2023, vol. 28, no. 3.
N. Francken, Sanctorum, J., Renders, J., Paramonov, P., Sijbers, J., and De Beenhouwer, J., A condensed history approach to x-ray dark field effects in edge illumination phase contrast simulations, in 45th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, 2023.PDF icon Download paper (4.14 MB)
L. F. Alves Pereira, De Beenhouwer, J., and Sijbers, J., The Deep Steerable Convolutional Framelet Network for Suppressing Directional Artifacts in X-ray Tomosynthesis, in 31st European Signal Processing Conference, EUSIPCO, 2023.
M. Yosifov, Weinberger, P., Reiter, M., Fröhler, B., De Beenhouwer, J., Sijbers, J., Kastner, J., and Heinzl, C., Defect detectability analysis via Probability of defect detection between traditional and deep learning methods in numerical simulations, in e-Journal of Nondestructive Testing, 2023, vol. 28, no. 3.PDF icon Download paper (2.37 MB)
J. Renders, Shafieizargar, B., Verhoye, M., De Beenhouwer, J., den Dekker, A. J., and Sijbers, J., DELTA-MRI: Direct deformation Estimation from LongiTudinally Acquired k-space data, in IEEE International Symposium on Biomedical Imaging, 2023, pp. 1-4.

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