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A. Presenti, Sijbers, J., den Dekker, A. J., and De Beenhouwer, J., CAD-based defect inspection with optimal view angle selection based on polychromatic X-ray projection images, in 9th Conference on Industrial Computed Tomography, Padova, Italy, 2019, pp. 1-5.PDF icon ict2019_full_paper_55.pdf (216.2 KB)
A. Presenti, Sijbers, J., and De Beenhouwer, J., Dynamic angle selection for few-view X-ray inspection of CAD based objects, in Proc. SPIE, 15th International Meeting on Fully Three-Dimensional Image Reconstruction in Radiology and Nuclear Medicine (Fully3D), 2019, vol. 11072.