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J. Fatermans, De Backer, A., den Dekker, A. J., and Van Aert, S., “Chapter Seven - Image-quality evaluation and model selection with maximum a posteriori probability”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
J. Fatermans, De Backer, A., den Dekker, A. J., and Van Aert, S., “Chapter Six - Atom column detection”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.