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Conference Paper
E. Bettens, den Dekker, A. J., Sijbers, J., and Van Dyck, D., Ultimate resolution in the framework of parameter estimation, in IASTED International Conference - Signal and Image Processing (SIP'98), Las Vegas, Nevada, USA, 1998, pp. 229-233.PDF icon Download paper (113.28 KB)
D. Van Dyck, den Dekker, A. J., Sijbers, J., and Bettens, E., Dose Limited Resolution, in Proceedings Microscopy and Microanalysis, Atlanta, Georgia, U.S.A, 1998, vol. 2, pp. 802-803.
E. Bettens, Scheunders, P., Sijbers, J., Van Dyck, D., and Moens, L., Automatic segmentation and modeling of two-dimensional electrophoresis gels, in Proceedings of IEEE International Conference on Image Processing, Lausanne, Switserland, 1996, vol. 2, pp. 665-668.
Book Chapter
D. Van Dyck, Bettens, E., Sijbers, J., den Dekker, A. J., van den Bos, A., Op de Beeck, M., Jansen, J., and Zandbergen, H., Resolving atoms: what do we have? what do we want?, in Institute of Physics Conference Series, vol. 153, J. M. Rodenburg, Ed. Cambridge, UK: Institute of Physics Ltd, 1997, pp. 95-100.