Publications

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1997
S. Livens, Scheunders, P., Van de Wouwer, G., Vautrot, P., and Van Dyck, D., Wavelets for texture analysis, an overview, in Proc. IEE International Conference on Image Processing and Applications , Dublin, 14-17 july, 1997, pp. 581-585.
1998
B. Weyn, Van de Wouwer, G., Van Daele, A., Scheunders, P., Van Dyck, D., Van Marck, E., and Jacob, W., Automated breast tumour diagnosis and grading based on wavelet chromatin texture description, Cytometry, vol. 33, pp. 32-40, 1998.
D. Meersman, Scheunders, P., and Van Dyck, D., Classification of microcalcifications using texture-based features, in Digital Mammography, 1998, pp. 233-236.
D. Meersman, Scheunders, P., and Van Dyck, D., Detection of microcalcifications using non-linear filtering, in Proc. EUSIPCO'98, European Signal Processing Conference, 1998, pp. 2465-2468.
D. Van Dyck, den Dekker, A. J., Sijbers, J., and Bettens, E., Dose Limited Resolution, in Proceedings Microscopy and Microanalysis, Atlanta, Georgia, U.S.A, 1998, vol. 2, pp. 802-803.
J. Sijbers, Estimation of Signal and Noise from Magnitude Magnetic Resonance Images, 1998.PDF icon Download PhD thesis (3.5 MB)
J. Sijbers, den Dekker, A. J., Van Dyck, D., and Raman, E., Estimation of signal and noise from Rician distributed data, in Proceedings of the IASTED International Conference on Signal Processing and Communications, Canary Islands, Spain, 1998, pp. 140-143.
J. Sijbers, den Dekker, A. J., Van Audekerke, J., Verhoye, M., and Van Dyck, D., Estimation of the noise in magnitude MR images, Magnetic Resonance Imaging, vol. 16, pp. 87-90, 1998.PDF icon Download paper (64.9 KB)
A. J. den Dekker, Sijbers, J., and Van Dyck, D., How to design an HREM experiment so as to attain the highest precision?, in ICEM14: 14th International Congress on Electron Microscopy, Cancun, Mexico, 1998, vol. 1, pp. 621-622.
S. Livens, Image Analysis for Material Characterisation, University of Antwerp, Antwerp, 1998.
J. Sijbers, den Dekker, A. J., Scheunders, P., and Van Dyck, D., Maximum Likelihood estimation of Rician distribution parameters, IEEE Transactions on Medical Imaging, vol. 17, pp. 357-361, 1998.PDF icon Download paper (106.26 KB)
A. J. den Dekker, Sijbers, J., Verhoye, M., and Van Dyck, D., Maximum Likelihood estimation of the signal component magnitude in phase contrast MR images, in Proceedings of SPIE Medical Imaging, San Diego, California, USA, 1998, vol. 3338, pp. 408-415.
J. Sijbers, den Dekker, A. J., Verhoye, M., and Van Dyck, D., Optimal estimation of T2 maps from magnitude MR data, in Proceedings of SPIE Medical Imaging, San Diego, CA, USA, 1998, vol. 3338, pp. 384-390.PDF icon Download paper (1.04 MB)
P. Jedrasik, Garcia, J., De Boeck, B., and Van Dyck, D., Optimal filtering versus regularization methods in the Fourier precompensation based proximity neurocorrection in electron beam lithography, Microelectronic Engineering, vol. 41, pp. 195-198, 1998.
A. J. den Dekker, Sijbers, J., and Van Dyck, D., Optimizing the design of an HREM experiment so as to attain the highest resolution, in Proceedings of FEMMS98: Frontiers of Electron Microscopy in Material Science, Kloster Irsee, Germany, 1998.
A. J. den Dekker, Sijbers, J., and Van Dyck, D., Optimizing the setting of an electron microscope for highest resolution using statistical parameter estimation theory, in Workshop: Towards Atomic Resolution Analysis 98, Port Ludlow, WA, U.S.A, 1998.
I. R. Tsang, Tsang, I. J., Scheunders, P., and Van Dyck, D., Pattern Recognition using neighborhood coding, in Proc. CVPRIP'98, Intern. Workshop on Computer Vision, Pattern Recognition and Image Processing , North Carolina, october 23-28, 1998, pp. 250-253.
G. Van de Wouwer, Scheunders, P., and Van Dyck, D., Rotation-Invariant Texture Characterization using Isotropic Wavelet Frames, in Proc. ICPR98, International Conference on Pattern Recognition , Brisbane, Australia, 17-20 august, 1998, pp. 814-816.
S. Livens, Van Roost, C., Scheunders, P., and Van Dyck, D., Tabular silver bromide micro-crystal characterisation using optical microscopy and colour-image analysis, in Proc. ICPS98, International Conference on Imaging Science , Antwerp, Belgium, 7-11/9, 1998.
E. Bettens, den Dekker, A. J., Sijbers, J., and Van Dyck, D., Ultimate resolution in the framework of parameter estimation, in IASTED International Conference - Signal and Image Processing (SIP'98), Las Vegas, Nevada, USA, 1998, pp. 229-233.PDF icon Download paper (113.28 KB)
P. Scheunders, Livens, S., Van de Wouwer, G., Vautrot, P., and Van Dyck, D., Wavelet-based texture analysis, Intern. Journal on Computer Science and Information Management, vol. 1, pp. 22-34, 1998.

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