Publications

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Journal Article
Bals, S., K. J. Batenburg, J. Verbeeck, J. Sijbers, and G. Van Tendeloo, "Quantitative three-dimensional reconstruction of catalyst particles for bamboo-like carbon nanotubes", Nano Letters, vol. 7, no. 12, pp. 3669-3674, 2007.
Zanaga, D., F. Bleichrodt, T. Altantzis, N. Winckelmans, W J. Palenstijn, J. Sijbers, B. van Nijs, M. A. van Huis, A. van Blaaderen, A. Sánchez-Iglesias, et al., "Quantitative 3D analysis of huge nanoparticle assemblies", Nanoscale, vol. 8, issue 1, pp. 292-299, 2015.
Zanaga, D., F. Bleichrodt, T. Altantzis, N. Winckelmans, W J. Palenstijn, J. Sijbers, B. de Nijs, M. A. van Huis, A. Sánchez-Iglesias, L. M. Liz-Marzán, et al., "Quantitative 3D analysis of huge nanoparticle assemblies.", Nanoscale, vol. 8, issue 1, pp. 292-9, 2016 Jan 7.
Van Eyndhoven, G., M. Kurttepeli, C. J. Van Oers, P. Cool, S. Bals, K. J. Batenburg, and J. Sijbers, "Pore REconstruction and Segmentation (PORES) method for improved porosity quantification of nanoporous materials", Ultramicroscopy, vol. 148, pp. 10-19, 2015.
Goris, B., J. De Beenhouwer, A. De Backer, D. Zanaga, K. J. Batenburg, A. Sánchez-Iglesias, L. M. Liz-Marzán, S. Van Aert, S. Bals, J. Sijbers, et al., "Measuring Lattice Strain in Three Dimensions through Electron Microscopy", Nano Letters, vol. 15, issue 10, pp. 6996–7001, 2015.
Van Aarle, W., W J. Palenstijn, J. De Beenhouwer, T. Altantzis, S. Bals, K. J. Batenburg, and J. Sijbers, "The ASTRA Toolbox: a platform for advanced algorithm development in electron tomography", Ultramicroscopy, vol. 157, pp. 35–47, 2015. PDF icon Download paper (3.47 MB)
Zanaga, D., T. Altantzis, J. Sanctorum, B. Freitag, and S. Bals, "An alternative approach for ζ-factor measurement using pure element nanoparticles", Ultramicroscopy, vol. 164, pp. 11–16, 2016.
Goris, B., T. Roelandts, K. J. Batenburg, H. Heidari Mezerji, and S. Bals, "Advanced reconstruction algorithms for electron tomography: from comparison to combination", Ultramicroscopy, vol. 127, pp. 40–47, 2013.
Van Aert, S., A. De Backer, G. T. Martinez, A J. den Dekker, D. Van Dyck, S. Bals, and G. Van Tendeloo, "Advanced electron crystallography through model-based imaging", IUCrJ, vol. 3, no. 1, Jan, 2016.
Roelandts, T., K. J. Batenburg, E. Biermans, C. Kubel, S. Bals, and J. Sijbers, "Accurate segmentation of dense nanoparticles by partially discrete electron tomography", Ultramicroscopy, vol. 114, pp. 96-105, 2012. PDF icon Download paper (1.71 MB)
Batenburg, K. J., S. Bals, J. Sijbers, C. Kubel, P. A. Midgley, J. C. Hernandez, U. Kaiser, E. R. Encina, E. A. Coronado, and G. Van Tendeloo, "3D imaging of nanomaterials by discrete tomography", Ultramicroscopy, vol. 109, pp. 730-740, 2009.