Publications
2018
S. Van Aert, Fatermans, J., De Backer, A., van den Bos, K. H. W., O'Leary, C. M., Müller-Caspary, K., Jones, L., Lobato, I., Béché, A., den Dekker, A. J., Bals, S., and Nellist, P. D.,
“Maximising dose efficiency in quantitative STEM to reveal the 3D atomic structure of nanomaterials”,
IMC19, Sydney, Australia. 2018.
2019
J. Fatermans, den Dekker, A. J., O'Leary, C. M., Nellist, P. D., and Van Aert, S.,
“Atom column detection from STEM images using the maximum a posteriori probability rule”,
MC 2019, Berlin, Germany. 2019.
2020
S. Van Aert, De Backer, A., De wael, A., Fatermans, J., Friedrich, T., Lobato, I., O'Leary, C. M., Varambhia, A., Altantzis, T., Jones, L., den Dekker, A. J., Nellist, P. D., and Bals, S.,
“3D Atomic Scale Quantification of Nanostructures and their Dynamics Using Model-based STEM”,
Microscopy & Microanalysis 2020 (online), Milwaukee, United States. 2020.
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