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2003
E. Van de Casteele, Van Dyck, D., Sijbers, J., and Raman, E., A model-based correction method for beam-hardening artifacts in X-ray tomography, in 22nd Benelux Meeting on Systems and Control, Lommel, Belgium, 2003.
E. Van de Casteele, Van Dyck, D., Sijbers, J., and Raman, E., Modelling of Beam hardening in micro CT, in IEEE International Symposium on Biomedical Imaging, Washington DC, USA, 2003, pp. 57-58.PDF icon Download full paper (163.52 KB)

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