Publications

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1997
Livens, S., P. Scheunders, G. Van de Wouwer, P. Vautrot, and D. Van Dyck, "Wavelets for texture analysis, an overview", Proc. IEE International Conference on Image Processing and Applications , Dublin, 14-17 july, pp. 581-585, 1997.
1998
Weyn, B., G. Van de Wouwer, A. Van Daele, P. Scheunders, D. Van Dyck, E. Van Marck, and W. Jacob, "Automated breast tumour diagnosis and grading based on wavelet chromatin texture description", Cytometry, vol. 33, pp. 32-40, 1998.
Meersman, D., P. Scheunders, and D. Van Dyck, "Classification of microcalcifications using texture-based features", Digital Mammography, pp. 233-236, 1998.
Meersman, D., P. Scheunders, and D. Van Dyck, "Detection of microcalcifications using non-linear filtering", Proc. EUSIPCO'98, European Signal Processing Conference, pp. 2465-2468, 1998.
Van Dyck, D., A J. den Dekker, J. Sijbers, and E. Bettens, "Dose Limited Resolution", Proceedings Microscopy and Microanalysis, vol. 2, no. 2, Atlanta, Georgia, U.S.A, pp. 802-803, July, 1998.
Sijbers, J., Estimation of Signal and Noise from Magnitude Magnetic Resonance Images, , 1998. PDF icon Download PhD thesis (3.5 MB)
Sijbers, J., A J. den Dekker, D. Van Dyck, and E. Raman, "Estimation of signal and noise from Rician distributed data", Proceedings of the IASTED International Conference on Signal Processing and Communications, Canary Islands, Spain, pp. 140-143, February, 1998.
Sijbers, J., A J. den Dekker, J. Van Audekerke, M. Verhoye, and D. Van Dyck, "Estimation of the noise in magnitude MR images", Magnetic Resonance Imaging, vol. 16, no. 1, pp. 87-90, 1998. PDF icon Download paper (64.9 KB)
den Dekker, A J., J. Sijbers, and D. Van Dyck, "How to design an HREM experiment so as to attain the highest precision?", ICEM14: 14th International Congress on Electron Microscopy, vol. 1, Cancun, Mexico, pp. 621-622, September, 1998.
Livens, S., Image Analysis for Material Characterisation, , Antwerp, University of Antwerp, 1998.
Sijbers, J., A J. den Dekker, P. Scheunders, and D. Van Dyck, "Maximum Likelihood estimation of Rician distribution parameters", IEEE Transactions on Medical Imaging, vol. 17, no. 3, pp. 357-361, 1998. PDF icon Download paper (106.26 KB)
den Dekker, A J., J. Sijbers, M. Verhoye, and D. Van Dyck, "Maximum Likelihood estimation of the signal component magnitude in phase contrast MR images", Proceedings of SPIE Medical Imaging, vol. 3338, San Diego, California, USA, pp. 408-415, February, 1998.
Sijbers, J., A J. den Dekker, M. Verhoye, and D. Van Dyck, "Optimal estimation of T2 maps from magnitude MR data", Proceedings of SPIE Medical Imaging, vol. 3338, San Diego, CA, USA, pp. 384-390, February, 1998. PDF icon Download paper (1.04 MB)
Jedrasik, P., J. Garcia, B. De Boeck, and D. Van Dyck, "Optimal filtering versus regularization methods in the Fourier precompensation based proximity neurocorrection in electron beam lithography", Microelectronic Engineering, vol. 41, pp. 195-198, 1998.
den Dekker, A J., J. Sijbers, and D. Van Dyck, "Optimizing the design of an HREM experiment so as to attain the highest resolution", Proceedings of FEMMS98: Frontiers of Electron Microscopy in Material Science, Kloster Irsee, Germany, April, 1998.
den Dekker, A J., J. Sijbers, and D. Van Dyck, "Optimizing the setting of an electron microscope for highest resolution using statistical parameter estimation theory", Workshop: Towards Atomic Resolution Analysis 98, Port Ludlow, WA, U.S.A, September, 1998.
Tsang, I R., I J. Tsang, P. Scheunders, and D. Van Dyck, "Pattern Recognition using neighborhood coding", Proc. CVPRIP'98, Intern. Workshop on Computer Vision, Pattern Recognition and Image Processing , North Carolina, october 23-28, pp. 250-253, 1998.
Van de Wouwer, G., P. Scheunders, and D. Van Dyck, "Rotation-Invariant Texture Characterization using Isotropic Wavelet Frames", Proc. ICPR98, International Conference on Pattern Recognition , Brisbane, Australia, 17-20 august, pp. 814-816, 1998.
Livens, S., C. Van Roost, P. Scheunders, and D. Van Dyck, "Tabular silver bromide micro-crystal characterisation using optical microscopy and colour-image analysis", Proc. ICPS98, International Conference on Imaging Science , Antwerp, Belgium, 7-11/9, 1998.
Bettens, E., A J. den Dekker, J. Sijbers, and D. Van Dyck, "Ultimate resolution in the framework of parameter estimation", IASTED International Conference - Signal and Image Processing (SIP'98), Las Vegas, Nevada, USA, pp. 229-233, October, 1998.
Scheunders, P., S. Livens, G. Van de Wouwer, P. Vautrot, and D. Van Dyck, "Wavelet-based texture analysis", Intern. Journal on Computer Science and Information Management, vol. 1, no. 2, pp. 22-34, 1998.

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