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Bettens, E., D. Van Dyck, A J. den Dekker, J. Sijbers, and A. van den Bos, "Model-based two-object resolution from observations having counting statistics", Ultramicroscopy, vol. 77, no. 1, pp. 37-48, 1999. PDF icon Download full paper (226 KB)
Bettens, E., P. Scheunders, D. Van Dyck, L. Moens, and V. P. Osta, "Computer Analysis of Two-Dimensional Electrophoresis Gels : A New Segmentation and Modeling Algorithm", Electrophoresis, vol. 18, pp. 792-798, 1997.
Bettens, E., P. Scheunders, J. Sijbers, D. Van Dyck, and L. Moens, "Automatic segmentation and modeling of two-dimensional electrophoresis gels", Proceedings of IEEE International Conference on Image Processing, vol. 2, Lausanne, Switserland, pp. 665-668, September, 1996.
Bettens, E., A J. den Dekker, J. Sijbers, and D. Van Dyck, "Ultimate resolution in the framework of parameter estimation", IASTED International Conference - Signal and Image Processing (SIP'98), Las Vegas, Nevada, USA, pp. 229-233, October, 1998.
Bettens, E., Peak Characterization using Parameter Estimation Methods, , Antwerp, University of Antwerp, 1999.