Publications

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2019
Fatermans, J., A J. den Dekker, C. M. O'Leary, P. D. Nellist, and S. Van Aert, "Atom column detection from STEM images using the maximum a posteriori probability rule", MC 2019, Berlin, Germany, 2019.
Fatermans, J., A J. den Dekker, and S. Van Aert, "Atom detection from electron microscopy images", RBSM 2019, Louvain-la-Neuve, Belgium, pp. 15, 2019.
Van Aert, S., A. De wael, J. Fatermans, I. Lobato, A. De Backer, L. Jones, A J. den Dekker, and P. D. Nellist, "Quantifying 3D atomic structures of nanomaterials and their dynamics using model-based scanning transmission electron microscopy", Spring Meeting of the EMRS, Nice, France, 2019.
Van Aert, S., A. De wael, J. Fatermans, I. Lobato, A. De Backer, L. Jones, A J. den Dekker, and P. D. Nellist, "Strategies for quantifying 3D atomic structures of nanomaterials and their dynamics using dose-efficient ADF STEM", PICO2019, Vaalsbroek, The Netherlands, 2019.
2018
Van Aert, S., J. Fatermans, A. De Backer, K.. H. W. van den Bos, C. M. O'Leary, K. Müller-Caspary, L. Jones, I. Lobato, A. Béché, A J. den Dekker, et al., "Maximising dose efficiency in quantitative STEM to reveal the 3D atomic structure of nanomaterials", IMC19, Sydney, Australia, 2018.