Publications

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Book Chapter
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., Chapter Eight - General conclusions and future perspectives, in Advances in Imaging and Electron Physics, vol. 216, Science Direct Elsevier, In Press.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., Chapter Five - Optimal experiment design for nanoparticle atom counting from ADF STEM images, in Advances in Imaging and Electron Physics, vol. 216, Science Direct Elsevier, In Press.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., Chapter Four - Atom counting, in Advances in Imaging and Electron Physics,, vol. 216, Science Direct Elsevier, In Press.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., Chapter One - Introduction, in Advances in Imaging and Electron Physics, vol. 216, Science Direct Elsevier, In Press.
J. Fatermans, De Backer, A., den Dekker, A. J., and Van Aert, S., Chapter Seven - Image-quality evaluation and model selection with maximum a posteriori probability, in Advances in Imaging and Electron Physics, vol. 216, Science Direct Elsevier, In Press.
J. Fatermans, De Backer, A., den Dekker, A. J., and Van Aert, S., Chapter Six - Atom column detection, in Advances in Imaging and Electron Physics, vol. 216, Science Direct Elsevier, In Press.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., Chapter Three - Efficient fitting algorithm, in Advances in Imaging and Electron Physics, vol. 216, Science Direct Elsevier, In Press.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., Chapter Two - Statistical parameter estimation theory: principles and simulation studies, in Advances in Imaging and Electron Physics, vol. 216, Science Direct Elsevier, In Press.
Journal Article
S. Van Aert, De Backer, A., Martinez, G. T., den Dekker, A. J., Van Dyck, D., Bals, S., and Van Tendeloo, G., Advanced electron crystallography through model-based imaging, IUCrJ, vol. 3, 2016.
J. Gonnissen, De Backer, A., den Dekker, A. J., Sijbers, J., and Van Aert, S., Atom-counting in High Resolution Electron Microscopy: TEM or STEM - that’s the question, Ultramicroscopy, vol. 147, pp. 112–120, 2017.
J. Gonnissen, De Backer, A., den Dekker, A. J., Sijbers, J., and Van Aert, S., Detecting and locating light atoms from high-resolution STEM images: the quest for a single optimal design Ultramicroscopy, Ultramicroscopy, vol. 170, pp. 128-138, 2016.
A. J. den Dekker, Gonnissen, J., De Backer, A., Sijbers, J., and Van Aert, S., Estimation of unknown structure parameters from high-resolution (S)TEM images: what are the limits?, Ultramicroscopy, vol. 134, pp. 34-43, 2013.
B. Goris, De Beenhouwer, J., De Backer, A., Zanaga, D., Batenburg, K. J., Sánchez-Iglesias, A., Liz-Marzán, L. M., Van Aert, S., Bals, S., Sijbers, J., and Van Tendeloo, G., Measuring Lattice Strain in Three Dimensions through Electron Microscopy, Nano Letters, vol. 15, no. 10, pp. 6996–7001, 2015.
J. Gonnissen, De Backer, A., den Dekker, A. J., Martinez, G. T., Rosenauer, A., Sijbers, J., and Van Aert, S., Optimal experimental design for the detection of light atoms from high-resolution scanning transmission electron microscopy images, Applied Physics Letters, vol. 105, no. 063116, 2014.
A. De Backer, van den Bos, K. H. W., Van den Broek, W., Sijbers, J., and Van Aert, S., StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images, Ultramicroscopy, vol. 171, pp. 104–116, 2016.