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Book Chapter
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., Chapter Eight - General conclusions and future perspectives, in Advances in Imaging and Electron Physics, vol. 216, Science Direct Elsevier, In Press.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., Chapter Five - Optimal experiment design for nanoparticle atom counting from ADF STEM images, in Advances in Imaging and Electron Physics, vol. 216, Science Direct Elsevier, In Press.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., Chapter Four - Atom counting, in Advances in Imaging and Electron Physics,, vol. 216, Science Direct Elsevier, In Press.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., Chapter One - Introduction, in Advances in Imaging and Electron Physics, vol. 216, Science Direct Elsevier, In Press.
J. Fatermans, De Backer, A., den Dekker, A. J., and Van Aert, S., Chapter Seven - Image-quality evaluation and model selection with maximum a posteriori probability, in Advances in Imaging and Electron Physics, vol. 216, Science Direct Elsevier, In Press.
J. Fatermans, De Backer, A., den Dekker, A. J., and Van Aert, S., Chapter Six - Atom column detection, in Advances in Imaging and Electron Physics, vol. 216, Science Direct Elsevier, In Press.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., Chapter Three - Efficient fitting algorithm, in Advances in Imaging and Electron Physics, vol. 216, Science Direct Elsevier, In Press.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., Chapter Two - Statistical parameter estimation theory: principles and simulation studies, in Advances in Imaging and Electron Physics, vol. 216, Science Direct Elsevier, In Press.