Publications

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2017
V. Van Nieuwenhove, De Beenhouwer, J., De Schryver, T., Van Hoorebeke, L., and Sijbers, J., Data-Driven Affine Deformation Estimation and Correction in Cone Beam Computed Tomography, IEEE Transactions on Image Processing, vol. 26, no. 3, pp. 1441-1451, 2017.
E. Janssens, De Beenhouwer, J., Sanctorum, J., Senck, S., Heinzl, C., and Sijbers, J., Dual axis Dark Field Contrast Tomography for visualisation of scattering directions in a CFRP sample, 4th Conference on X-ray and Neutron Phase Imaging with Gratings. Zürich, Switzerland, pp. 79-80, 2017.PDF icon Download poster (729.94 KB)PDF icon Download abstract (116.29 KB)
E. Janssens, Senck, S., Heinzl, C., Kastner, J., De Beenhouwer, J., and Sijbers, J., Fast Reconstruction of CFRP X-ray Images based on a Neural Network Filtered Backprojection Approach, in 7th Conference on Industrial Computed Tomography, Leuven, Belgium, 2017.PDF icon Download paper (345.06 KB)
J. Sijbers and De Beenhouwer, J., Mobile imaging of an object using penetrating radiation, U.S. Patent WO/2017/1783342017.
V. Van Nieuwenhove, Model-based reconstruction algorithms for dynamic X-ray CT, 2017.PDF icon Download thesis (4.65 MB)
V. Van Nieuwenhove, De Beenhouwer, J., Vlassenbroeck, J., Brennan, M., and Sijbers, J., MoVIT: A tomographic reconstruction framework for 4D-CT, Optics Express, vol. 25, no. 16, pp. 19236-19250, 2017.
V. Van Nieuwenhove, De Beenhouwer, J., Vlassenbroeck, J., Moesen, M., Brennan, M., and Sijbers, J., Registration Based SIRT: A reconstruction algorithm for 4D CT, in 7th Conference on Industrial Computed Tomography, Leuven, Belgium, 2017.PDF icon Download paper (2.36 MB)
J. Sanctorum, Janssens, E., den Dekker, A. J., Senck, S., Heinzl, C., De Beenhouwer, J., and Sijbers, J., A workflow to reconstruct grating-based X-ray phase contrast CT images: application to CFRP samples, 4th Conference on X-ray and Neutron Phase Imaging with Gratings. Zürich, Switzerland, pp. 139-140, 2017.PDF icon Download poster (1008.67 KB)PDF icon Download abstract (294.87 KB)
2016
W. Van Aarle, Cant, J., De Beenhouwer, J., and Sijbers, J., Discrete tomographic reconstruction from deliberately motion blurred X-ray projections, in 6th Conference on Industrial Computed Tomography, Wels, Austria, 2016, pp. 1-6.PDF icon Download paper (444.66 KB)
V. Van Nieuwenhove, De Beenhouwer, J., and Sijbers, J., Dynamic flat field correction in X-ray computed tomography, in Optimess conference, 2016, Antwerp.
G. Van Eyndhoven, De Beenhouwer, J., and Sijbers, J., A dynamic region estimation method for cerebral perfusion CT, in 6th International Conference on Optical Measurement Techniques for Structures and Systems (OPTIMESS), 2016, pp. 331-342.PDF icon Download paper (840.01 KB)
W. Van Aarle, Palenstijn, W. J., Cant, J., Janssens, E., Bleichrodt, F., Dabravolski, A., De Beenhouwer, J., Batenburg, K. J., and Sijbers, J., Fast and Flexible X-ray Tomography Using the ASTRA Toolbox, Optics Express, vol. 24, pp. 25129-25147, 2016.PDF icon Download paper (8.34 MB)
E. Janssens, Alves Pereira, L. F., De Beenhouwer, J., Tsang, I. R., Van Dael, M., Verboven, P., Nicolai, B., and Sijbers, J., Fast inline inspection by neural network based filtered backprojection: Application to apple inspection, Case Studies in Nondestructive Testing and Evaluation, vol. 6, pp. 14–20, 2016.PDF icon Download paper (726.63 KB)
B. Goris, De Beenhouwer, J., De Backer, A., Zanaga, D., Batenburg, K. J., Sánchez-Iglesias, A., Liz-Marzán, L. M., Van Aert, S., Sijbers, J., Van Tendeloo, G., and Bals, S., Investigating lattice strain in Au nanodecahedrons, European Microscopy Congress 2016. 2016.
K. Zarei Zefreh, De Beenhouwer, J., Welford, F. M., and Sijbers, J., Investigation on Effect of scintillator thickness on Afterglow in Indirect X-ray Detectors, in 6th Conference on Industrial Computed Tomography, Wels, Austria (iCT 2016), 2016.PDF icon Download paper (520.71 KB)
V. Van Nieuwenhove, Van Eyndhoven, G., Batenburg, K. J., Buls, N., Vandemeulebroucke, J., De Beenhouwer, J., and Sijbers, J., Local Attenuation Curve Optimization (LACO) framework for high quality perfusion maps in low-dose cerebral perfusion CT, Medical Physics, vol. 43, no. 12, pp. 6429-6438, 2016.
A. Dabravolski, De Beenhouwer, J., and Sijbers, J., Projection-based polygon estimation in X-ray computed tomography, in 6th International Conference on Optical Measurement Techniques for Structures and Systems (OPTIMESS), 2016, pp. 41-50.PDF icon Download paper (615.72 KB)
2015
V. Van Nieuwenhove, De Beenhouwer, J., De Schryver, T., Van Hoorebeke, L., and Sijbers, J., Affine deformation correction in cone beam Computed Tomography, in Fully Three-Dimensional Image Reconstruction in Radiology and Nuclear Medicine, Newport, Rhode Island, USA, 2015, pp. 182-185.PDF icon Download paper (2.91 MB)
W. Van Aarle, Palenstijn, W. J., De Beenhouwer, J., Altantzis, T., Bals, S., Batenburg, K. J., and Sijbers, J., The ASTRA Toolbox: a platform for advanced algorithm development in electron tomography, Ultramicroscopy, vol. 157, pp. 35–47, 2015.PDF icon Download paper (3.47 MB)
V. Van Nieuwenhove, De Beenhouwer, J., De Carlo, F., Mancini, L., Marone, F., and Sijbers, J., Dynamic intensity normalization using eigen flat fields in X-ray imaging, Optics Express, vol. 23, no. 21, pp. 27975-27989, 2015.Package icon Download Matlab code (2.92 MB)PDF icon Download paper (1.68 MB)
V. Van Nieuwenhove, De Beenhouwer, J., and Sijbers, J., A fast 4D CT reconstruction algorithm for affine deforming objects, Applied inverse problems conference. 2015.
E. Janssens, Pelt, D., De Beenhouwer, J., Van Dael, M., Verboven, P., Nicolai, B., and Sijbers, J., Fast Neural Network Based X-Ray Tomography of Fruit on a Conveyor Belt, Chemical Engineering Transactions, vol. 44, pp. 181-186, 2015.
B. Goris, De Beenhouwer, J., De Backer, A., Zanaga, D., Batenburg, K. J., Sánchez-Iglesias, A., Liz-Marzán, L. M., Van Aert, S., Bals, S., Sijbers, J., and Van Tendeloo, G., Measuring Lattice Strain in Three Dimensions through Electron Microscopy, Nano Letters, vol. 15, no. 10, pp. 6996–7001, 2015.
E. Janssens, De Beenhouwer, J., Van Dael, M., Verboven, P., Nicolai, B., and Sijbers, J., Neural Network Based X-Ray Tomography for Fast Inspection of Apples on a Conveyor Belt, in IEEE International Conference on Image Processing, 2015, pp. 917-921.

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