Publications

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Book Chapter
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., Chapter Eight - General conclusions and future perspectives, in Advances in Imaging and Electron Physics, vol. 216, Science Direct Elsevier, In Press.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., Chapter Five - Optimal experiment design for nanoparticle atom counting from ADF STEM images, in Advances in Imaging and Electron Physics, vol. 216, Science Direct Elsevier, In Press.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., Chapter Four - Atom counting, in Advances in Imaging and Electron Physics,, vol. 216, Science Direct Elsevier, In Press.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., Chapter One - Introduction, in Advances in Imaging and Electron Physics, vol. 216, Science Direct Elsevier, In Press.
J. Fatermans, De Backer, A., den Dekker, A. J., and Van Aert, S., Chapter Seven - Image-quality evaluation and model selection with maximum a posteriori probability, in Advances in Imaging and Electron Physics, vol. 216, Science Direct Elsevier, In Press.
J. Fatermans, De Backer, A., den Dekker, A. J., and Van Aert, S., Chapter Six - Atom column detection, in Advances in Imaging and Electron Physics, vol. 216, Science Direct Elsevier, In Press.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., Chapter Three - Efficient fitting algorithm, in Advances in Imaging and Electron Physics, vol. 216, Science Direct Elsevier, In Press.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., Chapter Two - Statistical parameter estimation theory: principles and simulation studies, in Advances in Imaging and Electron Physics, vol. 216, Science Direct Elsevier, In Press.
Conference Abstract
S. Van Aert, De Backer, A., De wael, A., Fatermans, J., Friedrich, T., Lobato, I., O'Leary, C. M., Varambhia, A., Altantzis, T., Jones, L., den Dekker, A. J., Nellist, P. D., and Bals, S., 3D Atomic Scale Quantification of Nanostructures and their Dynamics Using Model-based STEM, Microscopy & Microanalysis 2020 (online), Milwaukee, United States. 2020.
B. Goris, De Beenhouwer, J., De Backer, A., Zanaga, D., Batenburg, K. J., Sánchez-Iglesias, A., Liz-Marzán, L. M., Van Aert, S., Sijbers, J., Van Tendeloo, G., and Bals, S., Investigating lattice strain in Au nanodecahedrons, European Microscopy Congress 2016. 2016.
S. Van Aert, Fatermans, J., De Backer, A., van den Bos, K. H. W., O'Leary, C. M., Müller-Caspary, K., Jones, L., Lobato, I., Béché, A., den Dekker, A. J., Bals, S., and Nellist, P. D., Maximising dose efficiency in quantitative STEM to reveal the 3D atomic structure of nanomaterials, IMC19, Sydney, Australia. 2018.
S. Van Aert, De wael, A., Fatermans, J., Lobato, I., De Backer, A., Jones, L., den Dekker, A. J., and Nellist, P. D., Quantifying 3D atomic structures of nanomaterials and their dynamics using model-based scanning transmission electron microscopy, Spring Meeting of the EMRS, Nice, France. 2019.
S. Van Aert, De wael, A., Fatermans, J., Lobato, I., De Backer, A., Jones, L., den Dekker, A. J., and Nellist, P. D., Strategies for quantifying 3D atomic structures of nanomaterials and their dynamics using dose-efficient ADF STEM, PICO2019, Vaalsbroek, The Netherlands. 2019.
S. Van Aert, De Backer, A., De wael, A., Fatermans, J., E Irmak, A., Friedrich, T., Lobato, I., Jones, L., den Dekker, A. J., Nellist, P. D., and Bals, S., Strategies for quantifying the 3D atomic structure and the dynamics of nanomaterials using model-based STEM, Virtual MRS Spring/ Fall Meeting, Boston, United States (online). 2020.
Journal Article
S. Van Aert, De Backer, A., Martinez, G. T., den Dekker, A. J., Van Dyck, D., Bals, S., and Van Tendeloo, G., Advanced electron crystallography through model-based imaging, IUCrJ, vol. 3, 2016.
J. Gonnissen, De Backer, A., den Dekker, A. J., Sijbers, J., and Van Aert, S., Atom-counting in High Resolution Electron Microscopy: TEM or STEM - that’s the question, Ultramicroscopy, vol. 147, pp. 112–120, 2017.
J. Gonnissen, De Backer, A., den Dekker, A. J., Sijbers, J., and Van Aert, S., Detecting and locating light atoms from high-resolution STEM images: the quest for a single optimal design Ultramicroscopy, Ultramicroscopy, vol. 170, pp. 128-138, 2016.
A. J. den Dekker, Gonnissen, J., De Backer, A., Sijbers, J., and Van Aert, S., Estimation of unknown structure parameters from high-resolution (S)TEM images: what are the limits?, Ultramicroscopy, vol. 134, pp. 34-43, 2013.
B. Goris, De Beenhouwer, J., De Backer, A., Zanaga, D., Batenburg, K. J., Sánchez-Iglesias, A., Liz-Marzán, L. M., Van Aert, S., Bals, S., Sijbers, J., and Van Tendeloo, G., Measuring Lattice Strain in Three Dimensions through Electron Microscopy, Nano Letters, vol. 15, no. 10, pp. 6996–7001, 2015.
J. Gonnissen, De Backer, A., den Dekker, A. J., Martinez, G. T., Rosenauer, A., Sijbers, J., and Van Aert, S., Optimal experimental design for the detection of light atoms from high-resolution scanning transmission electron microscopy images, Applied Physics Letters, vol. 105, no. 063116, 2014.
A. De Backer, van den Bos, K. H. W., Van den Broek, W., Sijbers, J., and Van Aert, S., StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images, Ultramicroscopy, vol. 171, pp. 104–116, 2016.